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Applied Physics Letters

Volumn 98, Issue 16, 2011, Pages

Nanomanipulation of field emission measurement for vacuum nanodiodes based on uniform silicon nanowire emitters

(4) Chen, Pai Yen a Cheng, Tsung Chieh b Shieh, Jiann c Luo, Yun Cin d

a The University of Texas at Austin (United States)

b NATIONAL KAOHSIUNG UNIVERSITY OF APPLIED SCIENCES (Taiwan)

c NATIONAL UNITED UNIVERSITY (Taiwan)

d NATIONAL YANG MING UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COLD CATHODES; FIELD EMISSION MEASUREMENTS; FITTING CURVES; IN-SITU; LOCAL FIELD ENHANCEMENT; LOW POWER; NANO-DEVICES; NANO-GAP; NANODIODES; NANOMANIPULATIONS; NANOMOTORS; ONSET VOLTAGES; SILICON NANOWIRES; TUNGSTEN PROBES;

CURVE FITTING; FIELD EMISSION; FIELD EMISSION CATHODES; NANOTECHNOLOGY; NANOWIRES; TUNGSTEN; VACUUM;

THREE DIMENSIONAL;

EID: 79955420283 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3581036 Document Type: Article

Times cited : (5)

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