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Journal of Applied Physics

Volumn 109, Issue 7, 2011, Pages

Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy

(6) Piramanayagam, S N a Ranjbar, M a Tan, E L a Tan, H K a Sbiaa, R a Chong, T C a

a DATA STORAGE INSTITUTE (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

LINE SCAN; MAGNETIC FORCE; MAGNETIC NANOSTRUCTURES; MAGNETIC TRANSITIONS; MFM IMAGE; NM RESOLUTION; PERPENDICULAR MAGNETIC ANISOTROPY; PERPENDICULAR MEDIA; SUPERIOR RESOLUTION;

MAGNETIC FORCE MICROSCOPY; MAGNETISM;

MAGNETIC ANISOTROPY;

EID: 79955390406 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3551733 Document Type: Conference Paper

Times cited : (13)

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