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Journal of Applied Physics

Volumn 79, Issue 8 PART 2B, 1996, Pages 6448-6450

Superparamagnetic magnetic force microscopy tips

(4) Hopkins, P F a,c Moreland, John a Malhotra, S S b Liou, S H b

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b UNIVERSITY OF NEBRASKA LINCOLN (United States)

c Quantum Corporation (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATED MATERIALS; COBALT ALLOYS; COERCIVE FORCE; GRAIN SIZE AND SHAPE; IRON COMPOUNDS; MAGNETIC FIELDS; MAGNETIC HYSTERESIS; MICROSCOPIC EXAMINATION; PARAMAGNETISM; REMANENCE; SILICON; VOLUME FRACTION;

COBALT CHROMIUM ALLOYS; FREQUENCY SHIFTS; IRON SILICATES; MAGNETIC FORCE MICROSCOPY TIPS; SUPERPARAMAGNETISM;

MAGNETIC HEADS;

EID: 0030129307 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.361969 Document Type: Article

Times cited : (34)

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