A new technique for enhancing sensitivity of the 2ω method by applying a bismuth film thermoreflectance sensor on top of the metal film-dielectric substrate sample

Japanese Journal of Applied Physics

Volumn 50, Issue 4 PART 1, 2011, Pages

  Kato, Ryozo ^a   Xu, Yibin ^a   Goto, Masahiro ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATE EQUATION; AU FILM; BI FILMS; BISMUTH FILM; DIELECTRIC SUBSTRATES; INTERFACIAL THERMAL RESISTANCE; METAL FILM; TEMPERATURE RESPONSE; THERMAL CONDUCTION EQUATION; THERMAL RESISTANCE; THERMAL SYSTEMS; THERMOREFLECTANCE; THERMOREFLECTANCE COEFFICIENT; UNOBSERVABLE;

BISMUTH; GOLD; METALLIC FILMS; METALS; SENSORS; SUBSTRATES; TEMPERATURE MEASUREMENT;

DIELECTRIC MATERIALS;

EID: 79955157469     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.046602     Document Type: Article

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