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Volumn 50, Issue 4 PART 1, 2011, Pages

Effect of heat treatment on ion conductivity of hydrated ZrO2 thin films prepared by reactive sputtering using H2O gas

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBANCE PEAK; ABSORPTION PEAKS; AC IMPEDANCE MEASUREMENT; AFTER-HEAT TREATMENT; BEFORE AND AFTER; ION CONDUCTIVITIES; IONIC SPECIES; OH GROUP; PEAK INTENSITY;

EID: 79955131046     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.045804     Document Type: Article
Times cited : (5)

References (28)
  • 21
    • 79955154075 scopus 로고    scopus 로고
    • International Center for Diffraction Data (ICDD), Powder Diffraction File (PDF)-2, Release 2009, reference code 00-037-1484
    • International Center for Diffraction Data (ICDD), Powder Diffraction File (PDF)-2, Release 2009, reference code 00-037-1484.
  • 27
    • 0009968458 scopus 로고    scopus 로고
    • ed. G. Hass, M. H. Francombe, and R. W. Hoffman Academic Press, New York 1975
    • R. Jacobsson: in Physics of Thin Films, ed. G. Hass, M. H. Francombe, and R. W. Hoffman (Academic Press, New York, 1975) Vol. 8, 51.
    • Physics of Thin Films , vol.8 , pp. 51
    • Jacobsson, R.1
  • 28
    • 79955132625 scopus 로고    scopus 로고
    • (Electrochemical Method-Manual of Fundamental Measurement) (Kodansha, Tokyo 2002)[in Japanese]
    • T. Osaka, N. Oyama, and T. Ohsaka: Denki Kagaku Ho-Kiso Sokutei Manual (Electrochemical Method-Manual of Fundamental Measurement) (Kodansha, Tokyo, 2002) 94 [in Japanese].
    • Denki Kagaku Ho-Kiso Sokutei Manual , pp. 94
    • Osaka, T.1    Oyama, N.2    Ohsaka, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.