Crystallization and residual stress formation of sol-gel-derived zirconia films

Thin Solid Films

Volumn 308-309, Issue 1-4, 1997, Pages 363-368

  Mehner, A ^a   Klumper Westkamp H ^a   Hoffmann, F ^a   Mayr, P ^a  

^a STIFTUNG INSTITUT FÜR WERKSTOFFTECHNIK   (Germany)

Author keywords

Crystallite size; Film thickness; Microstrains; Phase transformation; Porosity; Residual stress; Sol gel method; ZrO2 films

Indexed keywords

CRYSTALLIZATION; FILM GROWTH; POROSITY; RESIDUAL STRESSES; SOL-GELS; STAINLESS STEEL; SUBSTRATES; THERMAL EFFECTS; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

CRYSTALLITE SIZE; MICROSTRAINS;

CERAMIC COATINGS;

EID: 4243244673     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00579-8     Document Type: Article

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