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Volumn 53, Issue 4, 2011, Pages 679-688

Effect of pressure and mechanical stress on the electronic properties of AlN and GaN

Author keywords

[No Author keywords available]

Indexed keywords


EID: 79955105670     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063783411040093     Document Type: Article
Times cited : (15)

References (29)
  • 1
    • 79955102728 scopus 로고    scopus 로고
    • E. A. Dobisz and L. A. Eldada (Eds.), San Diego, California, United States: SPIE-The International Society for Optical Engineering
    • S. Patil, N. Sinha, and R. V. N. Melnik, in Nanoengineering: Fabrication, Properties, Optics, and Devices: VI, Ed. by E. A. Dobisz and L. A. Eldada (SPIE-The International Society for Optical Engineering, San Diego, California, United States, 2009), p. 74020C-8.
    • (2009) Nanoengineering: Fabrication, Properties, Optics, and Devices: VI
    • Patil, S.1    Sinha, N.2    Melnik, R.V.N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.