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Volumn 4, Issue 1, 2007, Pages 204-207

Elastic constants of aluminum nitride

Author keywords

[No Author keywords available]

Indexed keywords

ALN THIN FILMS; ALUMINUM NITRIDE; BLUE LASERS; BRILLOUIN SPECTROSCOPY; BULK ALN; ELASTIC STIFFNESS CONSTANTS; GEOMETRICAL ARRANGEMENTS; INTERNATIONAL SYMPOSIUM; LIGHT-EMITTING DEVICES; NON-DESTRUCTIVE; OPTICAL CHARACTERIZATIONS; PHYSICAL VAPOR TRANSPORT; SCATTERING DIAGRAMS; WIDE-BAND GAP SEMICONDUCTORS; WURTZITE; WURTZITE TYPE;

EID: 36348998357     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200673503     Document Type: Conference Paper
Times cited : (67)

References (5)
  • 5
    • 49549118337 scopus 로고    scopus 로고
    • Properties of Advanced Semiconductor Materials John Wiley & Sons, Inc
    • Y. Goldberg, Properties of Advanced Semiconductor Materials (John Wiley & Sons, Inc., 2001).
    • (2001)
    • Goldberg, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.