|
Volumn 4, Issue 1, 2007, Pages 204-207
|
Elastic constants of aluminum nitride
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALN THIN FILMS;
ALUMINUM NITRIDE;
BLUE LASERS;
BRILLOUIN SPECTROSCOPY;
BULK ALN;
ELASTIC STIFFNESS CONSTANTS;
GEOMETRICAL ARRANGEMENTS;
INTERNATIONAL SYMPOSIUM;
LIGHT-EMITTING DEVICES;
NON-DESTRUCTIVE;
OPTICAL CHARACTERIZATIONS;
PHYSICAL VAPOR TRANSPORT;
SCATTERING DIAGRAMS;
WIDE-BAND GAP SEMICONDUCTORS;
WURTZITE;
WURTZITE TYPE;
ALUMINA;
ALUMINUM;
ALUMINUM COMPOUNDS;
CRYSTAL STRUCTURE;
ELECTRIC CONDUCTIVITY;
GALLIUM ALLOYS;
LASERS;
LIGHT EMISSION;
LIGHT EMITTING DIODES;
LIGHT METALS;
LIGHT SOURCES;
MOLECULAR BEAM EPITAXY;
NITRIDES;
OPTICAL DESIGN;
SEMICONDUCTOR DEVICES;
SEMICONDUCTOR DIODES;
SEMICONDUCTOR GROWTH;
SEMICONDUCTOR LASERS;
SEMICONDUCTOR MATERIALS;
SINGLE CRYSTALS;
STIFFNESS;
SUBSTRATES;
THICK FILMS;
THIN FILMS;
ZINC SULFIDE;
ELASTIC CONSTANTS;
|
EID: 36348998357
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200673503 Document Type: Conference Paper |
Times cited : (67)
|
References (5)
|