SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 98, Issue 15, 2011, Pages

Disproportionation and comproportionation reactions of resistive switching in polycrystalline NiOx films

(4) Chien, F S S a Wu, Y T a Lai, G L a Lai, Y H a

a TUNGHAI UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BISTABLES; CHEMICAL BONDING STATE; CONDUCTING ATOMIC FORCE MICROSCOPY; DISPROPORTIONATIONS; EXPANSION AND CONTRACTION; GIBBS ENERGY; HIGH POTENTIAL; NANO SCALE; NON-VOLATILE-MEMORY APPLICATIONS; POLYCRYSTALLINE; RESISTIVE SWITCHING;

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; SWITCHING SYSTEMS; THERMODYNAMICS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79954603851 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3574908 Document Type: Article

Times cited : (26)

References (15)

1
- 67650102619
- 0935-9648, 10.1002/adma.200900375
- R. Waser, R. Dittman, G. Stikov, and K. Szot, Adv. Mater. (Weinheim, Ger.) 0935-9648 21, 2632 (2009). 10.1002/adma.200900375
- (2009) Adv. Mater. (Weinheim, Ger.) , vol.21 , pp. 2632
- Waser, R.¹ Dittman, R.² Stikov, G.³ Szot, K.⁴

2
- 21644443347
- 0163-1918
- I. G. Baek, M. S. Lee, S. Seo, M. J. Lee, D. H. Seo, D. -S. Suh, J. C. Park, S. O. Park, H. S. Kim, I. K. Yoo, U. -I. Chung, and J. T. Moon, Tech. Dig.-Int. Electron Devices Meet. 0163-1918 2004, 587.
- (2004) Tech. Dig. - Int. Electron Devices Meet. , pp. 587
- Baek, I.G.¹ Lee, M.S.² Seo, S.³ Lee, M.J.⁴ Seo, D.H.⁵ Suh, D.-S.⁶ Park, J.C.⁷ Park, S.O.⁸ Kim, H.S.⁹ Yoo, I.K.¹⁰ Chung, U.-I.¹¹ Moon, J.T.¹²

3
- 36549080841
- Observation of electric-field induced Ni filament channels in polycrystalline Ni Ox film
- DOI 10.1063/1.2813617
- G. -S. Park, X. -S. Li, D. -C. Kim, R. -J. Jung, M. J. Lee, and S. Seo, Appl. Phys. Lett. 0003-6951 91, 222103 (2007) 10.1063/1.2813617 (Pubitemid 350191626)
- (2007) Applied Physics Letters , vol.91 , Issue.22 , pp. 222103
- Park, G.-S.¹ Li, X.-S.² Kim, D.-C.³ Jung, R.-J.⁴ Lee, M.-J.⁵ Seo, S.⁶

4
- 36048980286
- Resistance switching in the metal deficient-type oxides: NiO and CoO
- DOI 10.1063/1.2753101
- H. Shima, F. Takano, H. Akinaga, Y. Tamai, I. H. Inoue, and H. Takagi, Appl. Phys. Lett. 0003-6951 91, 012901 (2007). 10.1063/1.2753101 (Pubitemid 350092111)
- (2007) Applied Physics Letters , vol.91 , Issue.1 , pp. 012901
- Shima, H.¹ Takano, F.² Akinaga, H.³ Tamai, Y.⁴ Inoue, I.H.⁵ Takagi, H.⁶

5
- 33646885556
- Electrical observations of filamentary conductions for the resistive memory switching in NiO films
- DOI 10.1063/1.2204649
- D. C. Kim, S. Seo, E. Ahn, D. -S. Suh, M. J. Lee, B. -H. Park, I. K. Yoo, I. G. Baek, H. -J. Kim, E. K. Yim, J. E. Lee, S. O. Park, H. S. Kim, U. -I. Chung, J. T. Moon, and B. I. Ryu, Appl. Phys. Lett. 0003-6951 88, 202102 (2006). 10.1063/1.2204649 (Pubitemid 43781782)
- (2006) Applied Physics Letters , vol.88 , Issue.20 , pp. 202102
- Kim, D.C.¹ Seo, S.² Ahn, S.E.³ Suh, D.-S.⁴ Lee, M.J.⁵ Park, B.-H.⁶ Yoo, I.K.⁷ Baek, I.G.⁸ Kim, H.-J.⁹ Yim, E.K.¹⁰ Lee, J.E.¹¹ Park, S.O.¹² Kim, H.S.¹³ Chung, U.-I.¹⁴ Moon, J.T.¹⁵ Ryu, B.I.¹⁶

6
- 65249161894
- 1530-6984, 10.1021/nl803387q
- M. -J. Lee, S. Han, S. H. Jeon, B. H. Park, B. S. Kang, S. -E. Ahn, K. H. Kim, C. B. Lee, C. J. Kim, I. -K. Yoo, D. H. Seo, X. -S. Li, J. -B. Park, J. -H. Lee, and Y. Park, Nano Lett. 1530-6984 9, 1476 (2009). 10.1021/nl803387q
- (2009) Nano Lett. , vol.9 , pp. 1476
- Lee, M.-J.¹ Han, S.² Jeon, S.H.³ Park, B.H.⁴ Kang, B.S.⁵ Ahn, S.-E.⁶ Kim, K.H.⁷ Lee, C.B.⁸ Kim, C.J.⁹ Yoo, I.-K.¹⁰ Seo, D.H.¹¹ Li, X.-S.¹² Park, J.-B.¹³ Lee, J.-H.¹⁴ Park, Y.¹⁵

7
- 77955583640
- 0556-2805, 10.1103/PhysRevB.81.193202
- H. D. Lee, B. Magyrai-Köpe, and Y. Nishi, Phys. Rev. B 0556-2805 81, 193202 (2010). 10.1103/PhysRevB.81.193202
- (2010) Phys. Rev. B , vol.81 , pp. 193202
- Lee, H.D.¹ Magyrai-Köpe, B.² Nishi, Y.³

8
- 31144449823
- Reproducible resistive switching in nonstoichiometric nickel oxide films grown by rf reactive sputtering for resistive random access memory applications
- DOI 10.1116/1.1953687
- J. -W. Park, J. -W. Park, D. -Y. Kim, and J. -K. Lee, J. Vac. Sci. Technol. A 0734-2101 23, 1309 (2005) 10.1116/1.1953687 (Pubitemid 43126775)
- (2005) Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films , vol.23 , Issue.5 , pp. 1309-1313
- Park, J.-W.¹ Park, J.-W.² Kim, D.-Y.³ Lee, J.-K.⁴

9
- 34547191632
- Decrease in switching voltage fluctuation of PtNi Ox Pt structure by process control
- DOI 10.1063/1.2755712
- R. Jung, M. -J. Lee, S. Seo, D. C. Kim, G. -S. Park, J. -S. Kim, and B. H. Park, Appl. Phys. Lett. 0003-6951 91, 022112 (2007). 10.1063/1.2755712 (Pubitemid 47114739)
- (2007) Applied Physics Letters , vol.91 , Issue.2 , pp. 022112
- Jung, R.¹ Lee, M.-J.² Seo, S.³ Kim, D.C.⁴ Park, G.-S.⁵ Kim, K.⁶ Ahn, S.⁷ Park, Y.⁸ Yoo, I.-K.⁹ Kim, J.-S.¹⁰ Park, B.H.¹¹

10
- 0032182399
- 0042-207X, 10.1016/S0042-207X(98)00190-0
- I. Hotov, J. Huran, J. Janík, and A. P. Kobzev, Vacuum 0042-207X 51, 157 (1998). 10.1016/S0042-207X(98)00190-0
- (1998) Vacuum , vol.51 , pp. 157
- Hotov, I.¹ Huran, J.² Janík, J.³ Kobzev, A.P.⁴

11
- 0037438215
- 0556-2805, 10.1103/PhysRevB.67.035419
- S. Stanescu, C. Boeglin, A. Barbier, and J. -P. Deville, Phys. Rev. B 0556-2805 67, 035419 (2003). 10.1103/PhysRevB.67.035419
- (2003) Phys. Rev. B , vol.67 , pp. 035419
- Stanescu, S.¹ Boeglin, C.² Barbier, A.³ Deville, J.-P.⁴

12
- 76649133422
- 1748-3387, 10.1038/nnano.2009.456
- D. -K. Kwon, K. K. Kim, J. H. Jang, J. M. Jeon, M. H. Lee, G. H. Kim, X. -S. Li, G. -S. Park, B. Lee, S. Han, M. Kim, and C. S. Hwang, Nat. Nanotechnol. 1748-3387 5, 148 (2010). 10.1038/nnano.2009.456
- (2010) Nat. Nanotechnol. , vol.5 , pp. 148
- Kwon, D.-K.¹ Kim, K.K.² Jang, J.H.³ Jeon, J.M.⁴ Lee, M.H.⁵ Kim, G.H.⁶ Li, X.-S.⁷ Park, G.-S.⁸ Lee, B.⁹ Han, S.¹⁰ Kim, M.¹¹ Hwang, C.S.¹²

13
- 77955732575
- 0935-9648, 10.1002/adma.201000186
- J. P. Strachan, M. D. Pickett, J. J. Yang, S. Aloni, A. L. D. Kilcoyne, G. Medeiros-Ribeiro, and R. S. Williams, Adv. Mater. (Weinheim, Ger.) 0935-9648 22, 3573 (2010). 10.1002/adma.201000186
- (2010) Adv. Mater. (Weinheim, Ger.) , vol.22 , pp. 3573
- Strachan, J.P.¹ Pickett, M.D.² Yang, J.J.³ Aloni, S.⁴ Kilcoyne, A.L.D.⁵ Medeiros-Ribeiro, G.⁶ Williams, R.S.⁷

14
- 79954568477
- 10th ed., edited by B. G. G. Hawley (Van Nostrand Reinhold, New York)
- The Condensed Chemical Dictionary, 10th ed., edited by, B. G. G. Hawley, (Van Nostrand Reinhold, New York, 1981), p. 726.
- (1981) The Condensed Chemical Dictionary , pp. 726

15
- 0004119876
- McGraw-Hill, New York)
- P. R. Roberge, Handbook of Corrosion Engineering (McGraw-Hill, New York, 2000), p. 1104.
- (2000) Handbook of Corrosion Engineering , pp. 1104
- Roberge, P.R.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.