Structural evolution of self-assisted GaAs nanowires grown on Si(111)

Physica Status Solidi - Rapid Research Letters

Volumn 5, Issue 4, 2011, Pages 156-158

  Biermanns, Andreas ^a   Breuer, Steffen ^b   Davydok, Anton ^a   Geelhaar, Lutz ^b   Pietsch, Ullrich ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

GaAs; Nanowires; Structure; X ray diffraction

Indexed keywords

DIFFRACTION PEAKS; GAAS; GROWTH CONDITIONS; GROWTH TIME; INITIAL STAGES; LATTICE PARAMETERS; SI (1 1 1); STRUCTURAL EVOLUTION; STRUCTURE; WURTZITES; ZINC-BLENDE;

DIFFRACTION; GALLIUM ALLOYS; GALLIUM ARSENIDE; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; SEMICONDUCTING GALLIUM; X RAY DIFFRACTION; X RAYS; ZINC; ZINC SULFIDE;

NANOWIRES;

EID: 79954544091     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201105055     Document Type: Letter

References (18)

1. P. Yang, R. Yan, and M. Fardy, Nano Lett. 10, 1529 (2010).
2. R. Yan, D. Gargas, and P. Yang, Nature Photon. 3, 569 (2009).
3. R. S. Wagner and W. C. Ellis, Appl. Phys. Lett. 4, 89 (1964).
4. C. Colombo, D. Spirkoska, M. Frimmer, G. Abstreiter, and A. F. I. Morral, Phys. Rev. B 77 (2008).
5. M. Tchernycheva, J. C. Harmand, G. Patriarche, L. Travers, and G. E. Cirlin, Nanotechnology 17, 4025 (2006).
6. H. Shtrikman, R. Popovitz-Biro, A. Kretinin, and M. Heiblum, Nano Lett. 9, 215(2009).
7. D. Spirkoska, et al., Phys. Rev. B 80, 245325 (2009).
8. S. Plissard, K. A. Dick, G. Larrieu, S. Godey, A. Addad, X. Wallart, and P. Caroff, Nanotechnology 21, 385602 (2010).
9. K. A. Dick, P. Caroff, J. Bolinsson, M. E. Messing, J. Johansson, K. Deppert, L. R. Wallenberg, and L. Samuelson, Semicond. Sci. Technol. 25, 024009 (2010).
10. P. Krogstrup, R. Popovitz-Biro, E. Johnson, M. H. Madsen, J. Nygård, and H. Shtrikman, Nano Lett. 10, 4475 (2010).
11. J. H. Paek, T. Nishiwaki, M. Yamaguchi, and N. Sawaki, Phys. Status Solidi C 6, 1436 (2009).
12. L. Schubert, P. Werner, N. D. Zakharov, G. Gerth, F. M. Kolb, L. Long, U. Gosele, and T. Y. Tan, Appl. Phys. Lett. 84, 4968 (2004).
13. U. Pietsch, V. Holy, and T. Baumbach, High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures, Advanced Texts in Physics (Springer, Berlin, 2004).
14. S. O. Mariager, S. L. Lauridsen, C. B. Sorensen, A. Dohn, P. R. Willmott, J. Nygard, and R. Feidenhans'l, Nanotechnology 21, 115603 (2010).
15. C. Y. Yeh, Z. W. Lu, S. Froyen, and A. Zunger, Phys. Rev. B 46(16), 10086 (1992).
16. G. E. Cirlin, V. G. Dubrovskii, Y. B. Samsonenko, A. D. Bouravleuv, K. Durose, Y. Y. Proskuryakov, B. Mendes, L. Bowen, M. A. Kaliteevski, R. A. Abram, and D. Zeze, Phys. Rev. B 82, 035302 (2010).
17. F. Glas, J. C. Harmand, and G. Patriarche, Phys. Rev. Lett. 99, 146101 (2007).
18. G. E. Cirlin, V. G. Dubrovskii, I. P. Soshnikov, N. V. Sibirev, Yu. B. Samsonenko, A. D. Bouravleuv, J. C. Harmand, and F. Glas, Phys. Status Solidi RRL 3, 112 (2009).