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Volumn 14, Issue 6, 2011, Pages

H2O-assisted O2 adsorption in sol-gel derived amorphous indium gallium zinc oxide thin film transistors

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBED WATER; BACK CHANNELS; DEVICE CHARACTERISTICS; ENVIRONMENTAL EFFECTS; GAS PARTIAL PRESSURE; INDIUM GALLIUM ZINC OXIDES; OFF-CURRENT; ON-CURRENTS; OXYGEN MOLECULE; THERMAL-ANNEALING; VACUUM CONDITION;

EID: 79953780123     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3568831     Document Type: Article
Times cited : (20)

References (22)
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  • 4
    • 0038362743 scopus 로고    scopus 로고
    • Thin-film transistor fabricated in single-crystalline transparent oxide semiconductor
    • DOI 10.1126/science.1083212
    • K. Nomura, H. Ohta, K. Ueda, T. Kamiya, M. Hirano, and H. Hosono, Science, 300, 1260 (2003). 10.1126/science.1083212 (Pubitemid 36621429)
    • (2003) Science , vol.300 , Issue.5623 , pp. 1269-1272
    • Nomura, K.1    Ohta, H.2    Ueda, K.3    Kamiya, T.4    Hirano, M.5    Hosono, H.6
  • 8
    • 13544269370 scopus 로고    scopus 로고
    • High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer
    • DOI 10.1063/1.1843286, 013503
    • H. Q. Chiang, J. F. Wager, R. L. Hoffman, J. Jeong, and D. A. Keszler, Appl. Phys. Lett., 86, 013503 (2005). 10.1063/1.1843286 (Pubitemid 40219489)
    • (2005) Applied Physics Letters , vol.86 , Issue.1 , pp. 0135031-0135033
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  • 13
    • 39749191514 scopus 로고    scopus 로고
    • Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water
    • DOI 10.1063/1.2838380
    • J. S. Park, J. K. Jeong, H. J. Chung, Y. G. Mo, and H. D. Kim, Appl. Phys. Lett., 92, 072104 (2008). 10.1063/1.2838380 (Pubitemid 351304848)
    • (2008) Applied Physics Letters , vol.92 , Issue.7 , pp. 072104
    • Park, J.-S.1    Jeong, J.K.2    Chung, H.-J.3    Mo, Y.-G.4    Kim, H.D.5
  • 20
    • 1642528449 scopus 로고    scopus 로고
    • Control of catalytic reactions at the surface of a metal oxide nanowire by manipulating electron density inside it
    • DOI 10.1021/nl034968f
    • Y. Zhang, A. Kolmakov, S. Chretien, H. Metiu, and M. Moskovits, Nano Lett. 4, 403 (2004). 10.1021/nl034968f (Pubitemid 38402622)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.