Nanostructuring of BaF2 (1 1 1) surfaces by single slow highly charged ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 269, Issue 9, 2011, Pages 901-904

  El Said, A S ^a,b   Heller, R ^a   Facsko, S ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b Mansoura University   (Egypt)

Author keywords

BaF2; Highly charged ions; Nanostructures

Indexed keywords

BAF2; CHEMICAL ETCHING; DRESDENS; ELECTRON BEAM ION TRAPS; HIGHLY CHARGED IONS; HILLOCKS FORMATION; ION ENERGIES; LATTICE DAMAGE; NANO-STRUCTURING; SCANNING FORCE MICROSCOPY; SLOW HIGHLY CHARGED IONS; SURFACE NANOSTRUCTURE; SWIFT HEAVY ION IRRADIATION; TOPOGRAPHIC IMAGES;

BARIUM COMPOUNDS; ELECTRON BEAMS; IRRADIATION; NANOSTRUCTURES; PARTICLE BEAM INJECTION; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; XENON;

IONS;

EID: 79953752359     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.11.011     Document Type: Conference Paper

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