메뉴 건너뛰기




Volumn , Issue , 2011, Pages

Mechanical characterization of an Au-Ge solder alloy for high temperature electronic devices

Author keywords

[No Author keywords available]

Indexed keywords

CREEP AND FATIGUE; DEGRADATION OF THE MATERIAL; DISPLACEMENT RATE; ELASTO-VISCOPLASTIC; EXPERIMENTAL DATA; HIGH TEMPERATURE ELECTRONIC DEVICES; LOADING CONDITION; MECHANICAL BEHAVIOUR; MECHANICAL CHARACTERIZATIONS; MECHANICAL RESPONSE; SOLDER ALLOYS; UNIFIED VISCOPLASTIC MODELS;

EID: 79953736070     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (9)
  • 1
    • 34548175460 scopus 로고    scopus 로고
    • High-temperature operation of SiC power devices by low-temperature sintered silver die-attachment
    • DOI 10.1109/TADVP.2007.898628, Special Section on Wafer-Level Packaging
    • Bai, J.G.; Yin, J.; Zhang, Z.; Lu, G.Q. and Van Wyk, J.D. : High-Temperature Operation of SiC Power Devices by Low-Temperature Sintered Silver Die- Attachment, IEEE Transcations On Advanced Packaging, Vol. 30, No. 3, August 2007, pp. 506 - 510. (Pubitemid 47308009)
    • (2007) IEEE Transactions on Advanced Packaging , vol.30 , Issue.3 , pp. 506-510
    • Bai, J.G.1    Yin, J.2    Zhang, Z.3    Lu, G.-Q.4    Van Wyk, J.D.5
  • 2
    • 35348849542 scopus 로고    scopus 로고
    • Processing and characterization of nanosilver pastes for die-attaching SiC devices
    • DOI 10.1109/TEPM.2007.906508
    • Bai, J.G.; Calata, J.N.; and Lu, G.Q. : Processing and Characterization of Nanosilver Pastes for Die-Attaching SiC Devices. IEEE Transcations On Electronics Packaging Manufacturing, Vol. 30, No. 4, October 2007, pp. 241 - 245. (Pubitemid 47577904)
    • (2007) IEEE Transactions on Electronics Packaging Manufacturing , vol.30 , Issue.4 , pp. 241-245
    • Bai, J.G.1    Calata, J.N.2    Lu, G.-Q.3
  • 4
    • 51349117385 scopus 로고    scopus 로고
    • A new bonding technology dealing with large CTE mismatch between large Si chips and Cu substrates
    • Wang P.J., Kim J.S., and Lee C.C., A. : A New Bonding Technology Dealing with Large CTE Mismatch Between Large Si Chips and Cu Substrates. Electronic Components and Technology Conference 2008, pp. 1562 - 1568.
    • (2008) Electronic Components and Technology Conference , pp. 1562-1568
    • Wang, P.J.1    Kim, J.S.2    Lee, C.C.A.3
  • 5
    • 0035047415 scopus 로고    scopus 로고
    • The interdiffusion of Sn from AuSn solder with the barrier metal deposited on diamond
    • DOI 10.1016/S0025-5408(00)00478-5, PII S0025540800004785
    • Tjong, S.C.; Ho, H.P. and Lee, S.T. : The interdiffusion of Sn from AuSn solder with the barrier metal deposited on diamond, Materials Research Bulletin, Vol. 36, May 2001, pp. 153-160. (Pubitemid 32318124)
    • (2001) Materials Research Bulletin , vol.36 , Issue.1-2 , pp. 153-160
    • Tjong, S.C.1    Ho, H.P.2    Lee, S.T.3
  • 7
    • 0027066363 scopus 로고
    • A Nonlinear kinematic hardening theory for cyclic thermo plasticity and cyclic thermovisco plasticity
    • McDowell, D.L.: A Nonlinear kinematic hardening theory for cyclic thermoplasticity and cyclic thermoviscoplasticity, International Journal of Plasticity, Vol. 8, 1992, pp. 695-728.
    • (1992) International Journal of Plasticity , vol.8 , pp. 695-728
    • McDowell, D.L.1
  • 9
    • 0032027831 scopus 로고    scopus 로고
    • A finite element procedure of a cyclic thermoviscoplasticity model for solder and copper interconnects
    • Fu, C.; McDowell, D.L. and Ume, I.C. : A Finite Element Procedure of a Cyclic Thermoviscoplasticity Model for Solder and Copper Interconnects, Transactions of the ASME, Vol 120, 1998, pp. 24 - 34.
    • (1998) Transactions of the ASME , vol.120 , pp. 24-34
    • Fu, C.1    McDowell, D.L.2    Ume, I.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.