Enhanced surface potential variation on nanoprotrusions of GaN microbelt as a probe for humidity sensing

Journal of Physical Chemistry C

Volumn 115, Issue 13, 2011, Pages 5863-5867

  Sahoo, Prasana ^a   Oliveira, Douglas Soares ^b   Cotta, Mônica Alonso ^b   Dhara, Sandip ^a   Dash, S ^a   Tyagi, A K ^a   Raj, Baldev ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE ACCUMULATION; CHEMICAL SPECIES; CHEMICAL VAPOR; ENHANCED SURFACE; FREESTANDING GAN; HUMIDITY SENSING; INHOMOGENEITIES; KELVIN PROBE MICROSCOPY; MICROBELTS; MOISTURE LEVEL; NANOFEATURES; NANOPROTRUSIONS; NATIVE DEFECT; POTENTIAL VARIATIONS; REACTION MECHANISM; ROUGH SURFACES; SENSING APPLICATIONS; VAPOR-SOLID PROCESS; WATER MOLECULE;

CHEMICAL VAPOR DEPOSITION; GALLIUM NITRIDE; OXYGEN; PROBES; SURFACE POTENTIAL; SURFACE PROPERTIES;

SURFACE DEFECTS;

EID: 79953695379     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp111505m     Document Type: Article

References (20)

1. Chattopadhyay, S.; Ganguly, A.; Chen, K. H.; Chen, L. C. Crit. Rev. Solid State Mater. Sci. 2009, 34, 224-279
2. Lim, W.; Wright, J. S.; Gila, B. P.; Johnson, J. L.; Ural, A.; Anderson, T.; Ren, F.; Pearton, S. J. Appl. Phys. Lett. 2008, 93, 072109
3. Berven, C. A.; Dobrokhotov, V.; McIlroy, D. N.; Chava, S.; Abdelrahaman, R.; Heieren, A.; Dick, J.; Barredo, W. IEEE Sens. J. 2008, 8, 930-935
4. Lo, C. F.; Chang, C. Y.; Chu, B. H.; Pearton, S. J.; Dabiran, A.; Chow, P. P.; Ren, F. Appl. Phys. Lett. 2010, 96, 232106
5. Sahoo, P.; Basu, J.;; Dhara, S.; Fang, H.C.; Lu, C.P.; Ravindran, T.R.; Dash, S.; Tyagi, A. K. Unpublished manuscript.
6. Weaver, J. M. R.; Abraham, D. W. J. Vac. Sci. Technol., B 1991, 9, 1559-1561
7. Narvaez, C.; Chiaramonte, T.; Vicaro, K. O.; Clerici, J. H.; Cotta, M. A. Nanotechnology 2009, 20, 465705-465711
8. Vicaro, K. O.; Cotta, M. A.; Gutiérrez, H. R.; Bortoleto, J. R. R. Nanotechnology 2003, 14, 509-513
9. Sadewasser, S.; Leendertz, C.; Streicher, F.; Lux-Steiner, M. Ch. Nanotechnology 2009, 20, 505503
10. Hsu, J. W. P.; Ng, H. M.; Sergent, A. M.; Chu, S. N. G. Appl. Phys. Lett. 2002, 81, 3579-3581
11. Hansen, P. J.; Strausser, Y. E.; Erickson, A. N.; Tarsa, E. J.; Kozodoy, P.; Brazel, E. G.; Ibbetson, J. P.; Mishra, U.; Narayanamurti, V.; DenBaars, S. P.; Speck, J. S. Appl. Phys. Lett. 1998, 72, 2247-2249
12. Lin, L. M.; Lai, P. T. J. Electrochem. Soc. 2007, 154, G58-G62
13. Reshchikov, M. A.; Morkocis, H. J. Appl. Phys. 2005, 97, 061301
14. Neugebauer, J.; Van de Walle, C. G. Appl. Phys. Lett. 1996, 69, 503-505
15. Garcia, M. A.; Wolter, S. D.; Kim, T. -H.; Choi, S.; Baier, J.; Brown, A.; Losurdo, M.; Bruno, G. Appl. Phys. Lett. 2006, 88, 013506
16. Foussekis, M.; Baski, A. A.; Reshchikov, M. A. Appl. Phys. Lett. 2009, 94, 162116
17. Thiel, P. A.; Madey, T. E. Surf. Sci. Rep. 1987, 7, 211-285
18. Shen, X.; Allen, P. B.; Hybertsen, M. S.; Muckerman, J. T. J. Phys. Chem. C 2009, 113, 3365-3368
19. Bermudez, V. M.; Long, J. P. Surf. Sci. 2000, 450, 98-105
20. Lorenz, P.; Gutt, R.; Haensel, T.; Himmerlich, M.; Schaefer, J. A.; Krischok, S. Phys. Status Solidi C 2010, 7, 169-172