SCOPUS 정보 검색 플랫폼

Volumn 109, Issue 5, 2011, Pages

I-V measurement of NiO nanoregion during observation by transmission electron microscopy

(13) Fujii, Takashi a Arita, Masashi a Hamada, Kouichi a Kondo, Hirofumi a Kaji, Hiromichi a Takahashi, Yasuo a Moniwa, Masahiro b Fujiwara, Ichiro b Yamaguchi, Takeshi b Aoki, Masaki b Maeno, Yoshinori b Kobayashi, Toshio b Yoshimaru, Masaki b

a HOKKAIDO UNIVERSITY (Japan)

b SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CANDIDATE MATERIALS; CONDUCTION MEASUREMENT; COUNTER ELECTRODES; FORMING PROCESS; I-V MEASUREMENTS; INHOMOGENEITIES; LOW RESISTANCE; NANO SCALE; NANOREGIONS; NIO FILMS; RESISTANCE RANDOM ACCESS MEMORY; SIMULTANEOUS OBSERVATION; STRUCTURAL CHANGE; TEM; TEM IMAGES;

IRIDIUM; PLATINUM; RANDOM ACCESS STORAGE;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 79953011785 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3553868 Document Type: Article

Times cited : (21)

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