In situ conductance measurement of a limited number of nanoparticles during transmission electron microscopy observation

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 44, Issue 24-27, 2005, Pages

  Hirose, Ryusuke ^a,b   Arita, Masashi ^a   Hamada, Kouichi ^a   Takahashi, Yasuo ^a   Subagyo, Agus ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b JAPAN SOCIETY FOR THE PROMOTION OF SCIENCE   (Japan)

Author keywords

Coulomb blockade; Fe nanoparticle; Scanning tunnelling spectroscopy; Single electron tunnelling effect; Transmission electron microscopy

Indexed keywords

CONDUCTANCE MEASUREMENT; FE NANOPARTICLE; NANODOTS; SINGLE-ELECTRON TUNNELING EFFECT;

COULOMB BLOCKADE; ELECTRIC CONDUCTANCE; ELECTRIC VARIABLES MEASUREMENT; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 32044433325     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.L790     Document Type: Article

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