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Journal of Applied Physics

Volumn 109, Issue 5, 2011, Pages

Tuning the crystallographic and electronic properties of chromium oxynitride films

(5) Castaldi, L a,b Kurapov, D c Reiter, A c Shklover, V a Patscheider, J b

a ETH ZURICH (Switzerland)

b Laboratory for Nanoscale Materials Science (Switzerland)

c OC Oerlikon Balzers (Liechtenstein)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM OXYNITRIDE FILMS; CORE LEVELS; ELECTRICAL CONDUCTIVITY; FACE-CENTERED CUBIC; LATTICE PARAMETERS; NITROGEN ATOM; OXYGEN ADDITION; OXYGEN ANION; OXYGEN CONCENTRATIONS; OXYGEN CONTENT; PREFERRED ORIENTATIONS; VALENCE BAND EDGES;

BINDING ENERGY; CHARGE TRANSFER; CHROMIUM; ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ION EXCHANGE; NITRIDES; TUNING; X RAY PHOTOELECTRON SPECTROSCOPY;

OXYGEN;

EID: 79953003108 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3549115 Document Type: Article

Times cited : (12)

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