Metal/semiconductor phase transition in chromium nitride(001) grown by rf-plasma-assisted molecular-beam epitaxy

Applied Physics Letters

Volumn 85, Issue 26, 2004, Pages 6371-6373

  Constantin, Costel ^a   Haider, Muhammad B ^a   Ingram, David ^a   Smith, Arthur R ^a  

^a OHIO UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION RESISTANCE; CRYSTAL STRUCTURE; ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; PHASE TRANSITIONS; PLASMAS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

PLASMA-ASSISTED MOLECULAR-BEAM EPITAXY; SEMICONDUCTOR SURFACES; SINGLE-PHASE THIN FILMS; TUNNELING SPECTROSCOPY;

CHROMIUM COMPOUNDS;

EID: 13444251213     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1836878     Document Type: Article

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