X-rays diffraction on a new chromium oxide single-crystal thin film prepared by molecular beam epitaxy

Journal of Crystal Growth

Volumn 293, Issue 1, 2006, Pages 228-232

  Du, X S ^a,b   Hak, S ^b   Hibma, T ^b   Rogojanu, O C ^b   Struth, B ^c  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

A1. Characterization; A1. Crystal structure; A1. X ray diffraction; A3. Molecular beam epitaxy; B1. Oxide

Indexed keywords

CHARACTERIZATION; CRYSTAL STRUCTURE; FILM GROWTH; MOLECULAR BEAM EPITAXY; OXIDES; SINGLE CRYSTALS; X RAY DIFFRACTION;

BODY-CENTRED ORTHORHOMBIC STRUCTURE; CHROMIUM OXIDE FILMS; RECIPROCAL SPACE MAPPING; SYNCHROTRON Q SCANS;

CHROMIUM COMPOUNDS;

EID: 33745952153     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.05.013     Document Type: Article

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