On measurement of optical band gap of chromium oxide films containing both amorphous and crystalline phases

Journal of Non-Crystalline Solids

Volumn 221, Issue 2-3, 1997, Pages 245-254

  Hong, Seungbum ^a   Kim, Eunah ^a   Kim, Dae Weon ^a   Sung, Tae Hyun ^b   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Electric Power Research Institute (KEPRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEPOSITION; OPTICAL VARIABLES MEASUREMENT; OXIDES; PHASE TRANSITIONS; SEMICONDUCTING FILMS; THIN FILMS;

CHROMIUM OXIDE FILM; OPTICAL BAND GAP MEASUREMENT;

AMORPHOUS FILMS;

EID: 0031358134     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(97)00367-0     Document Type: Article

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