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Volumn , Issue , 2011, Pages 31-36

AdaMS: Adaptive MLC/SLC phase-change memory design for file storage

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL DATAS; FILE STORAGE; MANAGEMENT POLICY; MEMORY DESIGN; MEMORY TECHNOLOGY; MULTILEVEL CELL; NAND FLASH; PHASE CHANGES; PROGRAMMING TIME; RE-CONFIGURABLE; RECONFIGURATION ABILITY; RUNTIMES; WORKLOAD CHARACTERISTICS;

EID: 79952967239     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2011.5722206     Document Type: Conference Paper
Times cited : (76)

References (13)
  • 1
    • 58149231291 scopus 로고    scopus 로고
    • A bipolar-selected phase change memory featuring multi-level cell storage
    • F. Bedeschi, R. Fackenthal, C. Resta, E. Donze et al., "A bipolar-selected phase change memory featuring multi-level cell storage," IEEE Journal of Solid-State Circuits, vol. 44, no. 1, pp. 217-227, 2009.
    • (2009) IEEE Journal of Solid-State Circuits , vol.44 , Issue.1 , pp. 217-227
    • Bedeschi, F.1    Fackenthal, R.2    Resta, C.3    Donze, E.4
  • 8
    • 70349317377 scopus 로고    scopus 로고
    • Characterization of phase change memory materials using phase change bridge devices
    • D. Krebs, S. Raoux, C. T. Rettner, G. W. Burr et al., "Characterization of phase change memory materials using phase change bridge devices," Journal of Applied Physics, vol. 106, no. 5, p. 054308, 2009.
    • (2009) Journal of Applied Physics , vol.106 , Issue.5 , pp. 054308
    • Krebs, D.1    Raoux, S.2    Rettner, C.T.3    Burr, G.W.4
  • 11
    • 59849124819 scopus 로고    scopus 로고
    • Degradation of the reset switching during endurance testing of a phase-change line cell
    • L. Goux, D. Tio Castro, G. Hurkx, J. Lisoni et al., "Degradation of the reset switching during endurance testing of a phase-change line cell," IEEE Transactions on Electron Devices, vol. 56, no. 2, pp. 354-358, 2009.
    • (2009) IEEE Transactions on Electron Devices , vol.56 , Issue.2 , pp. 354-358
    • Goux, L.1    Tio Castro, D.2    Hurkx, G.3    Lisoni, J.4
  • 12
    • 79952945745 scopus 로고    scopus 로고
    • Storage Performance Council, "I/O Trace Repository," http://www.storageperformance.org/specs/#traces.
    • I/O Trace Repository


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.