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Volumn , Issue , 2008, Pages 327-338

Improving NAND flash based disk caches

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURAL SUPPORT; CELL DENSITIES; DISK CACHING; ERROR CODING; GENERAL-PURPOSE COMPUTING; HARD DISK DRIVE; HIGH-DENSITY; INTERNATIONAL SYMPOSIUM; LOW POWERS; MEMORY CELLS; MOORE'S LAWS; MP-3 PLAYERS; MULTI-LEVEL CELLS; NAND FLASH; OVERALL POWER; PERFORMANCE DEGRADATION; PROCESS SCALING; SERVER PLATFORMS; SYSTEM MEMORY;

EID: 52649114930     PISSN: 10636897     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCA.2008.32     Document Type: Conference Paper
Times cited : (223)

References (26)
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    • Flash Solid State Drive
  • 2
    • 52649145613 scopus 로고    scopus 로고
    • Hard Disk Drive Specification. Hitachi Travelstar 7K60 2.5 inch ATA/IDE Hard Disk Drive Model: HTS726060M9 ATOO. http://www.hitachigst.com/tech/techlib. nsf/techdocs/53989D390D44D88F86256D1F0058368D/$file/T7K60_sp2.0.pdf.
    • Hard Disk Drive Specification. Hitachi Travelstar 7K60 2.5 inch ATA/IDE Hard Disk Drive Model: HTS726060M9 ATOO. http://www.hitachigst.com/tech/techlib. nsf/techdocs/53989D390D44D88F86256D1F0058368D/$file/T7K60_sp2.0.pdf.
  • 4
    • 34547184820 scopus 로고    scopus 로고
    • Samsung NAND Flash Memory Datasheet. http://www.Samsung.com/products/ semiconductor/NANDFlash/SLC_LargeBlock/8Gbit/K9K8G08U0A/K9K8G08U0A.htm.
    • Samsung NAND Flash Memory Datasheet
  • 5
    • 84941094289 scopus 로고    scopus 로고
    • Seagate Barracuda. http://www.seagate.com/products/personal/index.html.
    • Seagate Barracuda
  • 8
    • 52649100789 scopus 로고    scopus 로고
    • University of Massachusetts Trace Repository
    • University of Massachusetts Trace Repository. http://traces.es.umass.edu/ index.php/Storage/Storage.
  • 13
  • 17
    • 33751022280 scopus 로고    scopus 로고
    • Future Outlook of NAND Flash Technology for 40nm Node and Beyond
    • Feb
    • K. Kim and J. Choi. Future Outlook of NAND Flash Technology for 40nm Node and Beyond. In Workshop on Non-Volatile Semiconductor Memory, pages 9-11, Feb 2006.
    • (2006) Workshop on Non-Volatile Semiconductor Memory , pp. 9-11
    • Kim, K.1    Choi, J.2
  • 23
    • 11144248077 scopus 로고    scopus 로고
    • N. Mielke, H. Belgal, I. Kalastirsky, P. Kalavade, A. Kurtz, Q. Meng, N. Righos, and J. Wu. Flash EEPROM Threshold Instabilities due to Charge Trapping During Program/Erase Cycling. IEEE trans. on device and materials and reliability, 4(3), Sep 2004.
    • N. Mielke, H. Belgal, I. Kalastirsky, P. Kalavade, A. Kurtz, Q. Meng, N. Righos, and J. Wu. Flash EEPROM Threshold Instabilities due to Charge Trapping During Program/Erase Cycling. IEEE trans. on device and materials and reliability, 4(3), Sep 2004.
  • 26
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    • M. Wu and W. Zwaenepoel. eNVy: A Non-Volatile, Main Memory Storage System. In Proc. Int'l Conf. on Arch. Support for Prog. Lang, and Oper. Sys., Oct. 1994.
    • M. Wu and W. Zwaenepoel. eNVy: A Non-Volatile, Main Memory Storage System. In Proc. Int'l Conf. on Arch. Support for Prog. Lang, and Oper. Sys., Oct. 1994.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.