Impact of Cu/III ratio on the near-surface defects in polycrystalline CuGaSe2 thin films

Applied Physics Letters

Volumn 98, Issue 11, 2011, Pages

  Islam, M M ^a,c   Uedono, A ^a   Ishibashi, S ^b   Tenjinbayashi, K ^a   Sakurai, T ^a   Yamada, A ^b   Ishizuka, S ^b   Matsubara, K ^b   Niki, S ^b   Akimoto, K ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

NEAR SURFACE REGIONS; NEAR-SURFACE DEFECTS; POLYCRYSTALLINE; POSITRON ANNIHILATION SPECTRA; S PARAMETERS; SHAPE PARAMETERS; THEORETICAL CALCULATIONS; VACANCY-TYPE DEFECTS;

COPPER; POINT DEFECTS; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; SCATTERING PARAMETERS; THIN FILMS;

SURFACE DEFECTS;

EID: 79952934117     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3567006     Document Type: Article

References (23)

1. I. Repins, M. A. Contreras, B. Egaas, C. DeHart, J. Scharf, C. L. Perkins, B. To, and R. Noufi, Prog. Photovoltaics 1062-7995 16, 235 (2008). 10.1002/pip.822
2. W. Shockley and H. Queisser, J. Appl. Phys. 0021-8979 32, 510 (1961). 10.1063/1.1736034
3. S. Chichibu, T. Mizutani, K. Murakami, T. Shioda, T. Kurafuji, H. Nakanishi, S. Niki, P. J. Fons, and A. Yamada, J. Appl. Phys. 83, 3678 (1998). 10.1063/1.366588
4. V. Nadenau, D. Hariskos, and H. W. Schock, Proceedings of the 14th European Photovoltaic Solar Energy Conference (H. S. Stephens, Bedford, UK, 1997), p. 1250.
5. J. AbuShama, R. Noufi, S. Johnston, S. Ward, and X. Wu, Proceedings of the 31st IEEE Photovoltaic Specialists Conference (IEEE, New York, 2005), p. 299.
6. M. Turcu and U. Rau, in Wide-Gap Chalcopyrites, edited by, S. Siebentritt, and, U. Rau, (Springer, Berlin, Heidelberg, 2006), Vol. 86. 10.1007/3-540-31293-5-6
7. M. M. Islam, T. Sakurai, S. Ishizuka, A. Yamada, H. Shibata, K. Sakurai, K. Matsubara, S. Niki, and K. Akimoto, J. Cryst. Growth 0022-0248 311, 2212 (2009). 10.1016/j.jcrysgro.2008.12.005
8. A. Uedono, T. Koida, A. Tsukazaki, M. Kawasaki, Z. Q. Chen, S. F. Chichibu, and H. Koinuma, J. Appl. Phys. 0021-8979 93, 2481 (2003). 10.1063/1.1539915
9. A. Uedono, K. Shimoyama, M. Kiyohara, Z. Q. Chen, K. Yamabe, T. Ohdaira, R. Suzuki, and T. Mikado, J. Appl. Phys. 0021-8979 91, 5307 (2002). 10.1063/1.1462852 (Pubitemid 34599011)
10. R. Suzuki, T. Ohdaira, S. Ishibashi, A. Uedono, S. Niki, P. Fons, A. Yamada, T. Mikado, T. Yamazaki, and S. Tanigawa, Inst. Phys. Conf. Ser. 0305-2346 152, 757 (1998).
11. A. J. Nelson, A. M. Gabor, M. A. Contreras, R. Noufi, P. E. Sobol, P. Asoka-Kumar, and K. G. lynn, J. Appl. Phys. 0021-8979 78, 269 (1995). 10.1063/1.360669
12. K. Sakurai, R. Hunger, N. Tsuchimochi, T. Baba, K. Matsubara, P. Fons, A. Yamada, T. Kojima, T. Deguchi, H. Nakanishi, and S. Niki, Thin Solid Films 0040-6090 431-432, 6 (2003). 10.1016/S0040-6090(03)00226-8
13. V. Nadenau, D. Hariskos, H. -W. Schock, M. Krejci, F. -J. Haug, A. N. Tiwari, H. Zogg, and G. Kostorz, J. Appl. Phys. 0021-8979 85, 534 (1999). 10.1063/1.369486 (Pubitemid 129710169)
14. R. Krause-Rehberg and H. S. Leipner, Positron Annihilation in Semiconductors Defect Studies (Springer, Berlin, 1999).
15. X. D. Pi, P. G. Coleman, C. L. Tseng, C. P. Burrows, B. Yavich, and W. N. Wang, J. Phys.: Condens. Matter 0953-8984 14, L243 (2002). 10.1088/0953-8984/ 14/12/102 (Pubitemid 34307795)
16. S. Ishibashi, Mater. Sci. Forum 0255-5476 445-446, 401 (2004). 10.4028/www.scientific.net/MSF.445-446.401
17. F. Börner, J. Gebauer, S. Eichler, R. Krause-Rehberg, I. Dirnstorfer, B. K. Meyer, and F. Karg, Physica B 0921-4526 273-274, 930 (1999). 10.1016/S0921-4526(99)00557-8 (Pubitemid 30522523)
18. Y. J. Zhao, C. Persson, S. Lany, and A. Zunger, Appl. Phys. Lett. 0003-6951 85, 5860 (2004). 10.1063/1.1830074 (Pubitemid 40817921)
19. S. Lany and A. Zunger, J. Appl. Phys. 0021-8979 100, 113725 (2006). 10.1063/1.2388256 (Pubitemid 46012191)
20. S. B. Zhang, S. H. Wei, A. Zunger, and H. Katayama-Yoshida, Phys. Rev. B 0556-2805 57, 9642 (1998). 10.1103/PhysRevB.57.9642
21. K. Gartsman, L. Chernyak, V. Lyahovitskaya, D. Cahena, V. Didik, V. Kozlovsky, R. Malkovich, E. Skoryatina, and V. Usacheva, J. Appl. Phys. 0021-8979 82, 4282 (1997). 10.1063/1.366252
22. S. Niki, A. Yamada, R. Hunger, P. J. Fons, K. Iwata, K. Matsubara, A. Nishio, and H. Nakanishi, J. Cryst. Growth 0022-0248 237-239, 1993 (2002). 10.1016/S0022-0248(01)02302-8 (Pubitemid 34545227)
23. C. Domain, S. Laribi, S. Taunier, and J. F. Guillemoles, J. Phys. Chem. Solids 0022-3697 64, 1657 (2003). 10.1016/S0022-3697(03)00208-7