Tracing gold nanoparticle charge by electrolyte-insulator-semiconductor devices

Journal of Physical Chemistry C

Volumn 115, Issue 11, 2011, Pages 4439-4445

  Gun, Jenny ^a   Gutkin, Vitaly ^a   Lev, Ovadia ^a   Boyen, Hans Gerd ^b   Saitner, Marc ^b   Wagner, Patrick ^b   D'Olieslaeger, Marc ^b   Abouzar, Maryam H ^c,d   Poghossian, Arshak ^c,d   Schöning, Michael J ^c,d  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b HASSELT UNIVERSITY   (Belgium)

^c AACHEN UNIVERSITY OF APPLIED SCIENCES   (Germany)

^d FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS OXIDATION; BINDING ENERGY SHIFTS; BIOSENSING; C-V CURVE; CAPACITANCE VOLTAGE; CHARGE STATE; EIS STRUCTURES; ELECTROLYTE-INSULATOR-SEMICONDUCTOR; FIELD-EFFECT; FIELD-EFFECT DEVICES; FLAT BAND; GOLD NANOPARTICLES; NEW OPPORTUNITIES; OXYGEN PLASMA TREATMENTS; OXYGEN-PLASMA TREATMENT; REFERENCE METHOD; SENSOR SURFACES; SUPPORTED GOLD; XPS;

BINDING ENERGY; BIOASSAY; BIOCHIPS; ELECTROCHEMICAL CORROSION; ELECTROLYTES; NANOPARTICLES; OXYGEN; PLASMA APPLICATIONS; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

GOLD;

EID: 79952852817     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp109886s     Document Type: Article

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