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Volumn 8, Issue 3, 2011, Pages 779-783
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Scanning tunneling microscopy investigations of the epitaxial growth of ZrB2 on Si(111)
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Author keywords
Chemical vapor deposition; Scanning tunneling microscopy; Si(111); Surface reconstruction; Zirconium diboride
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Indexed keywords
DOMINANT ORIENTATION;
ELONGATED STRUCTURES;
EPITAXIAL RELATIONSHIPS;
EPITAXIALLY GROWN;
IN-PLANE;
SCANNING TUNNELING MICROSCOPY (STM);
SI (1 1 1);
ZIRCONIUM DIBORIDE;
BORIDES;
CHEMICAL VAPOR DEPOSITION;
CRYSTALLITES;
EPITAXIAL GROWTH;
SCANNING;
SCANNING TUNNELING MICROSCOPY;
SILICON;
SURFACE RECONSTRUCTION;
ZIRCONIUM;
ZIRCONIUM COMPOUNDS;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 79952652671
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.201000282 Document Type: Article |
Times cited : (8)
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References (11)
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