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Volumn 3, Issue 3, 2011, Pages 792-810

Pitfalls in the characterization of nanoporous and nanosized materials

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL TOOL; EXPERIMENTAL DATA; EXPERIMENTAL SETUP; INORGANIC MATTERS; NANO-POROUS; NANO-SIZED; NANOPOROUS MATERIALS; NANOSIZED MATERIALS; NEW MATERIAL; PHYSICAL METHODS; SURFACE SPECTROSCOPY; X-RAY POWDER;

EID: 79952642177     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c0nr00561d     Document Type: Review
Times cited : (191)

References (66)
  • 50
    • 0000934915 scopus 로고
    • ed. J. Rouquerol, F. Rodrigues-Reinoso, K. S. W. Singh and K. K. Unger, Elsevier, Amsterdam
    • J. P. Olivier, W. B. Conkin and M. Szombathely, in Characterization of Porous Solids III, ed., J. Rouquerol,,, F. Rodrigues-Reinoso,,, K. S. W. Singh, and, K. K. Unger,, Elsevier, Amsterdam, 1994, pp. 81-80
    • (1994) Characterization of Porous Solids III , pp. 81-80
    • Olivier, J.P.1    Conkin, W.B.2    Szombathely, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.