Photoluminescence imaging of focused ion beam induced individual quantum dots

Nano Letters

Volumn 11, Issue 3, 2011, Pages 1040-1043

  Lee, Jieun ^a   Saucer, Timothy W ^a   Martin, Andrew J ^a   Tien, Deborah ^a   Millunchick, Joanna M ^a   Sih, Vanessa ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

confocal microscopy; focused ion beam patterning; photoluminescence; Quantum dots

Indexed keywords

DOT EMISSIONS; GOOD OPTICAL QUALITY; INAS QUANTUM DOTS; INHOMOGENEITIES; ION BEAM PATTERNING; MICROPHOTOLUMINESCENCE; OPTICALLY ACTIVE; PHOTOLUMINESCENCE IMAGING; QUANTUM DOT; QUANTUM DOTS;

BEAM PLASMA INTERACTIONS; CONFOCAL MICROSCOPY; FOCUSED ION BEAMS; INDIUM ARSENIDE; ION BOMBARDMENT; IONS; MULTILAYERS; OPTICAL MULTILAYERS; PHOTOLUMINESCENCE; PHOTOMAPPING;

SEMICONDUCTOR QUANTUM DOTS;

EID: 79952596821     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl1038902     Document Type: Article

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