메뉴 건너뛰기




Volumn 98, Issue 9, 2011, Pages

Thermal boundary resistance of copper phthalocyanine-metal interface

Author keywords

[No Author keywords available]

Indexed keywords

COPPER PHTHALOCYANINE; HEAT CARRIERS; HEAT TRANSFER PROCESS; INORGANIC MATERIALS; INTERFACE DENSITY; METAL INTERFACE; MULTI-LAYER THIN FILM; THERMAL BOUNDARY RESISTANCE; THERMAL MANAGEMENT; VACUUM THERMAL EVAPORATION; WEAK BONDING;

EID: 79952419541     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3555449     Document Type: Article
Times cited : (40)

References (27)
  • 6
    • 17744393623 scopus 로고    scopus 로고
    • Measurement of thermal boundary conductance of a series of metal-dielectric interfaces by the transient thermoreflectance technique
    • DOI 10.1115/1.1857944
    • R. J. Stevens, A. N. Smith, and P. M. Norris, J. Heat Transfer 0022-1481 127, 315 (2005). 10.1115/1.1857944 (Pubitemid 40579043)
    • (2005) Journal of Heat Transfer , vol.127 , Issue.3 , pp. 315-322
    • Stevens, R.J.1    Smith, A.N.2    Norris, P.M.3
  • 11
    • 36549099049 scopus 로고
    • 0034-6748, 10.1063/1.1141498
    • D. G. Cahill, Rev. Sci. Instrum. 0034-6748 61, 802 (1990). 10.1063/1.1141498
    • (1990) Rev. Sci. Instrum. , vol.61 , pp. 802
    • Cahill, D.G.1
  • 13
    • 33750530867 scopus 로고    scopus 로고
    • Reexamining the 3-omega technique for thin film thermal characterization
    • DOI 10.1063/1.2349601
    • T. Tong and A. Majumdar, Rev. Sci. Instrum. 0034-6748 77, 104902 (2006). 10.1063/1.2349601 (Pubitemid 44664946)
    • (2006) Review of Scientific Instruments , vol.77 , Issue.10 , pp. 104902
    • Tong, T.1    Majumdar, A.2
  • 14
    • 0032615074 scopus 로고    scopus 로고
    • 0021-8979, 10.1063/1.370523
    • Y. S. Ju and K. E. Goodson, J. Appl. Phys. 0021-8979 85, 7130 (1999). 10.1063/1.370523
    • (1999) J. Appl. Phys. , vol.85 , pp. 7130
    • Ju, Y.S.1    Goodson, K.E.2
  • 15
    • 79952419052 scopus 로고    scopus 로고
    • note
    • The entire sample was placed on a glass carrier, which was treated as an adiabatic boundary in the model. The 3ω voltage was measured by a lock-in amplifier. The current modulation frequency range was 6 Hz to 2 kHz, much lower than the characteristic thermal diffusion frequency for the CuPc and metal films.
  • 17
    • 79952387452 scopus 로고    scopus 로고
    • note
    • The parasitic current was measured by applying voltage to two separate metal electrodes deposited on the multilayer structure, and proved to be at least 10 000 times smaller than the total current.
  • 18
    • 79952386707 scopus 로고    scopus 로고
    • X-ray diffraction indicated identical phases present in CuPc films throughout the thickness range examined
    • X-ray diffraction indicated identical phases present in CuPc films throughout the thickness range examined.
  • 20
    • 3042633856 scopus 로고    scopus 로고
    • 0003-6951, 10.1063/1.1758301
    • A. Majumdar and P. Reddy, Appl. Phys. Lett. 0003-6951 84, 4768 (2004). 10.1063/1.1758301
    • (2004) Appl. Phys. Lett. , vol.84 , pp. 4768
    • Majumdar, A.1    Reddy, P.2
  • 21
    • 41649100525 scopus 로고    scopus 로고
    • Influence of inelastic scattering at metal-dielectric interfaces
    • DOI 10.1115/1.2787025
    • P. E. Hopkins, R. J. Stevens, and P. M. Norris, ASME J. Heat Transfer 0022-1481 130, 022401 (2008). 10.1115/1.2787025 (Pubitemid 351479494)
    • (2008) Journal of Heat Transfer , vol.130 , Issue.2 , pp. 022401
    • Hopkins, P.E.1    Norris, P.M.2    Stevens, R.J.3
  • 22
    • 0000946149 scopus 로고
    • 0556-2805, 10.1103/PhysRevB.48.16373
    • R. J. Stoner and H. J. Maris, Phys. Rev. B 0556-2805 48, 16373 (1993). 10.1103/PhysRevB.48.16373
    • (1993) Phys. Rev. B , vol.48 , pp. 16373
    • Stoner, R.J.1    Maris, H.J.2
  • 23
    • 59349110666 scopus 로고    scopus 로고
    • 0003-6951, 10.1063/1.3075065
    • R. Prasher, Appl. Phys. Lett. 0003-6951 94, 041905 (2009). 10.1063/1.3075065
    • (2009) Appl. Phys. Lett. , vol.94 , pp. 041905
    • Prasher, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.