-
1
-
-
0031268714
-
-
0021-8979, 10.1063/1.366220
-
C. Peng, L. Cheng, and M. Mansuripur, J. Appl. Phys. 0021-8979 82, 4183 (1997). 10.1063/1.366220
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 4183
-
-
Peng, C.1
Cheng, L.2
Mansuripur, M.3
-
2
-
-
0001552921
-
-
0003-6951, 10.1063/1.126852
-
E. K. Kim, S. I. Kwun, S. M. Lee, H. Seo, and J. G. Yoon, Appl. Phys. Lett. 0003-6951 76, 3864 (2000). 10.1063/1.126852
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 3864
-
-
Kim, E.K.1
Kwun, S.I.2
Lee, S.M.3
Seo, H.4
Yoon, J.G.5
-
3
-
-
61349132073
-
-
1616-301X, 10.1002/adfm.200800984
-
Y. K. Koh, Y. Cao, D. G. Cahill, and D. Jena, Adv. Funct. Mater. 1616-301X 19, 610 (2009). 10.1002/adfm.200800984
-
(2009)
Adv. Funct. Mater.
, vol.19
, pp. 610
-
-
Koh, Y.K.1
Cao, Y.2
Cahill, D.G.3
Jena, D.4
-
4
-
-
77955301909
-
-
0022-1481, 10.1115/1.4000052
-
J. Alvarez-Quintana, L. I. Peralba-Garcia, J. L. Labar, and J. Rodriguez-Viejo, J. Heat Transfer 0022-1481 132, 032402 (2010). 10.1115/1.4000052
-
(2010)
J. Heat Transfer
, vol.132
, pp. 032402
-
-
Alvarez-Quintana, J.1
Peralba-Garcia, L.I.2
Labar, J.L.3
Rodriguez-Viejo, J.4
-
5
-
-
33846602674
-
2 crystals
-
DOI 10.1126/science.1136494
-
C. Chiritescu, D. G. Cahill, N. Nguyen, D. Johnson, A. Bodapati, P. Keblinski, and P. Zschack, Science 0036-8075 315, 351 (2007). 10.1126/science.1136494 (Pubitemid 46175510)
-
(2007)
Science
, vol.315
, Issue.5810
, pp. 351-353
-
-
Chiritescu, C.1
Cahill, D.G.2
Nguyen, N.3
Johnson, D.4
Bodapati, A.5
Keblinski, P.6
Zschack, P.7
-
6
-
-
17744393623
-
Measurement of thermal boundary conductance of a series of metal-dielectric interfaces by the transient thermoreflectance technique
-
DOI 10.1115/1.1857944
-
R. J. Stevens, A. N. Smith, and P. M. Norris, J. Heat Transfer 0022-1481 127, 315 (2005). 10.1115/1.1857944 (Pubitemid 40579043)
-
(2005)
Journal of Heat Transfer
, vol.127
, Issue.3
, pp. 315-322
-
-
Stevens, R.J.1
Smith, A.N.2
Norris, P.M.3
-
7
-
-
67649464339
-
-
0003-6951, 10.1063/1.3154557
-
S. Chung, J. H. Lee, J. Jeong, J. J. Kim, and Y. Hong, Appl. Phys. Lett. 0003-6951 94, 253302 (2009). 10.1063/1.3154557
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 253302
-
-
Chung, S.1
Lee, J.H.2
Jeong, J.3
Kim, J.J.4
Hong, Y.5
-
8
-
-
71949123503
-
-
0003-6951, 10.1063/1.3272110
-
Y. S. Tsai, S. H. Wang, C. H. Chen, C. L. Cheng, and T. C. Liao, Appl. Phys. Lett. 0003-6951 95, 233306 (2009). 10.1063/1.3272110
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 233306
-
-
Tsai, Y.S.1
Wang, S.H.2
Chen, C.H.3
Cheng, C.L.4
Liao, T.C.5
-
9
-
-
0032608124
-
-
0003-6951, 10.1063/1.124309
-
V. -E. Choong, S. Shi, J. Curless, C. -L. Shieh, H. -C. Lee, F. So, J. Shen, and J. Yang, Appl. Phys. Lett. 0003-6951 75, 172 (1999). 10.1063/1.124309
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 172
-
-
Choong, V.-E.1
Shi, S.2
Curless, J.3
Shieh, C.-L.4
Lee, H.-C.5
So, F.6
Shen, J.7
Yang, J.8
-
10
-
-
28844488281
-
Thermal transport properties of thin films of small molecule organic semiconductors
-
DOI 10.1063/1.2140478, 241908
-
N. Kim, B. Demercq, S. Yoo, A. Christensen, B. Kippelen, and S. Graham, Appl. Phys. Lett. 0003-6951 87, 241908 (2005). 10.1063/1.2140478 (Pubitemid 41780813)
-
(2005)
Applied Physics Letters
, vol.87
, Issue.24
, pp. 1-3
-
-
Kim, N.1
Domercq, B.2
Yoo, S.3
Christensen, A.4
Kippelen, B.5
Graham, S.6
-
11
-
-
36549099049
-
-
0034-6748, 10.1063/1.1141498
-
D. G. Cahill, Rev. Sci. Instrum. 0034-6748 61, 802 (1990). 10.1063/1.1141498
-
(1990)
Rev. Sci. Instrum.
, vol.61
, pp. 802
-
-
Cahill, D.G.1
-
12
-
-
0035306385
-
-
0034-6748, 10.1063/1.1353189
-
T. Borca-Tasciuc, A. R. Kumar, and G. Chen, Rev. Sci. Instrum. 0034-6748 72, 2139 (2001). 10.1063/1.1353189
-
(2001)
Rev. Sci. Instrum.
, vol.72
, pp. 2139
-
-
Borca-Tasciuc, T.1
Kumar, A.R.2
Chen, G.3
-
13
-
-
33750530867
-
Reexamining the 3-omega technique for thin film thermal characterization
-
DOI 10.1063/1.2349601
-
T. Tong and A. Majumdar, Rev. Sci. Instrum. 0034-6748 77, 104902 (2006). 10.1063/1.2349601 (Pubitemid 44664946)
-
(2006)
Review of Scientific Instruments
, vol.77
, Issue.10
, pp. 104902
-
-
Tong, T.1
Majumdar, A.2
-
14
-
-
0032615074
-
-
0021-8979, 10.1063/1.370523
-
Y. S. Ju and K. E. Goodson, J. Appl. Phys. 0021-8979 85, 7130 (1999). 10.1063/1.370523
-
(1999)
J. Appl. Phys.
, vol.85
, pp. 7130
-
-
Ju, Y.S.1
Goodson, K.E.2
-
15
-
-
79952419052
-
-
note
-
The entire sample was placed on a glass carrier, which was treated as an adiabatic boundary in the model. The 3ω voltage was measured by a lock-in amplifier. The current modulation frequency range was 6 Hz to 2 kHz, much lower than the characteristic thermal diffusion frequency for the CuPc and metal films.
-
-
-
-
16
-
-
62549092709
-
-
0021-8979, 10.1063/1.3078808
-
Y. K. Koh, S. L. Singer, W. Kim, J. M. O. Zide, H. Lu, D. G. Cahill, A. Majumdar, and A. C. Gossard, J. Appl. Phys. 0021-8979 105, 054303 (2009). 10.1063/1.3078808
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 054303
-
-
Koh, Y.K.1
Singer, S.L.2
Kim, W.3
Zide, J.M.O.4
Lu, H.5
Cahill, D.G.6
Majumdar, A.7
Gossard, A.C.8
-
17
-
-
79952387452
-
-
note
-
The parasitic current was measured by applying voltage to two separate metal electrodes deposited on the multilayer structure, and proved to be at least 10 000 times smaller than the total current.
-
-
-
-
18
-
-
79952386707
-
-
X-ray diffraction indicated identical phases present in CuPc films throughout the thickness range examined
-
X-ray diffraction indicated identical phases present in CuPc films throughout the thickness range examined.
-
-
-
-
19
-
-
1142310597
-
3 nanolaminates
-
DOI 10.1126/science.1093711
-
R. M. Costescu, D. G. Cahill, F. H. Fabrequette, Z. A. Sechrist, and S. M. George, Science 0036-8075 303, 989 (2004). 10.1126/science.1093711 (Pubitemid 38209697)
-
(2004)
Science
, vol.303
, Issue.5660
, pp. 989-990
-
-
Costescu, R.M.1
Cahill, D.G.2
Fabreguette, F.H.3
Sechrist, Z.A.4
George, S.M.5
-
21
-
-
41649100525
-
Influence of inelastic scattering at metal-dielectric interfaces
-
DOI 10.1115/1.2787025
-
P. E. Hopkins, R. J. Stevens, and P. M. Norris, ASME J. Heat Transfer 0022-1481 130, 022401 (2008). 10.1115/1.2787025 (Pubitemid 351479494)
-
(2008)
Journal of Heat Transfer
, vol.130
, Issue.2
, pp. 022401
-
-
Hopkins, P.E.1
Norris, P.M.2
Stevens, R.J.3
-
22
-
-
0000946149
-
-
0556-2805, 10.1103/PhysRevB.48.16373
-
R. J. Stoner and H. J. Maris, Phys. Rev. B 0556-2805 48, 16373 (1993). 10.1103/PhysRevB.48.16373
-
(1993)
Phys. Rev. B
, vol.48
, pp. 16373
-
-
Stoner, R.J.1
Maris, H.J.2
-
23
-
-
59349110666
-
-
0003-6951, 10.1063/1.3075065
-
R. Prasher, Appl. Phys. Lett. 0003-6951 94, 041905 (2009). 10.1063/1.3075065
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 041905
-
-
Prasher, R.1
-
24
-
-
55249110630
-
-
0021-8979, 10.1063/1.3000441
-
M. Hu, P. Keblinski, J. -S. Wang, and N. Raravikar, J. Appl. Phys. 0021-8979 104, 083503 (2008). 10.1063/1.3000441
-
(2008)
J. Appl. Phys.
, vol.104
, pp. 083503
-
-
Hu, M.1
Keblinski, P.2
Wang, J.-S.3
Raravikar, N.4
-
25
-
-
2942534950
-
-
0368-2048, 10.1016/j.elspec.2004.02.092
-
A. Ruocco, F. Evangelista, A. Attili, M. P. Donzello, M. G. Betti, L. Giovanelli, and R. Gotler, J. Electron Spectrosc. Relat. Phenom. 0368-2048 137-140, 165 (2004). 10.1016/j.elspec.2004.02.092
-
(2004)
J. Electron Spectrosc. Relat. Phenom.
, vol.137-140
, pp. 165
-
-
Ruocco, A.1
Evangelista, F.2
Attili, A.3
Donzello, M.P.4
Betti, M.G.5
Giovanelli, L.6
Gotler, R.7
-
26
-
-
34547152653
-
Formation of sharp metal-organic semiconductor interfaces: Ag and Sn on CuPc
-
DOI 10.1140/epjb/e2007-00192-5
-
V. Y. Aristov, O. V. Molodtsova, V. M. Zhilin, Y. A. Ossipyan, D. V. Vyalikh, B. P. Doyle, S. Nannaroneand, and M. Knupfer, Eur. Phys. J. B 1434-6028 57, 379 (2007). 10.1140/epjb/e2007-00192-5 (Pubitemid 47115592)
-
(2007)
European Physical Journal B
, vol.57
, Issue.4
, pp. 379-384
-
-
Aristov, V.Yu.1
Molodtsova, O.V.2
Zhilin, V.M.3
Ossipyan, Yu.A.4
Vyalikh, D.V.5
Doyle, B.P.6
Nannarone, S.7
Knupfer, M.8
-
27
-
-
0035894206
-
16CuPc case
-
DOI 10.1063/1.1419263
-
C. Shen, A. Kahn, and J. Schwartz, J. Appl. Phys. 0021-8979 90, 6236 (2001). 10.1063/1.1419263 (Pubitemid 34046787)
-
(2001)
Journal of Applied Physics
, vol.90
, Issue.12
, pp. 6236
-
-
Shen, C.1
Kahn, A.2
Schwartz, J.3
|