The studies on the role of fluorine in SnO2:F films prepared by spray pyrolysis with SnCl4

Journal of Optoelectronics and Advanced Materials

Volumn 13, Issue 1, 2011, Pages 95-99

  Zhang, B ^a,b   Tian, Y ^a   Zhang, J X ^a,b   Caib, W ^b  

^a SHANDONG UNIVERSITY   (China)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Defects; FTIR; Infrared reflectivity; Scattering

Indexed keywords

CARRIER CONCENTRATION; DEFECTS; FILM PREPARATION; FLUORINE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OXYGEN; REFLECTION; SCATTERING; SEMICONDUCTOR DOPING;

EXPERIMENTAL EVIDENCE; FLUORINE CONCENTRATIONS; FLUORINE SUBSTITUTION; FT-IR SPECTRUM; FTIR; INFRARED REFLECTIVITY; INTERSTITIAL SITES; SPRAY PYROLYSIS METHOD;

SPRAY PYROLYSIS;

EID: 79952321959     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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