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Journal of Alloys and Compounds

Volumn 509, Issue 13, 2011, Pages 4603-4607

X-ray photoelectron spectroscopic study of catalyst based zinc oxide thin films

(2) Shinde, S S a Rajpure, K Y a

a SHIVAJI UNIVERSITY (India)

Author keywords

Auger parameter; Bond iconicity; Catalyst; Chemical shifts; XPS

Indexed keywords

ADSORBED SPECIES; AUGER PARAMETERS; BOND ICONICITY; CHEMICAL ENVIRONMENT; CHEMICAL STATE; CORE LINES; ELEMENTAL COMPOSITIONS; EXPERIMENTAL DETERMINATION; FIRST-PRINCIPLES APPROACHES; HIGH RESOLUTION; HIGH SENSITIVITY; RESPONSE FUNCTIONS; SPECTROSCOPIC STUDIES; SPRAY TECHNIQUE; SURFACE AND INTERFACES; SURFACE COMPOSITIONS; X-RAY PHOTOELECTRONS; XPS; XPS ANALYSIS; ZINC OXIDE THIN FILMS;

AUGERS; CATALYSTS; CHEMICAL SHIFT; ELECTRONS; OXIDE FILMS; PHOTOELECTRICITY; PHOTONS; SPECTROSCOPIC ANALYSIS; X RAYS; ZINC; ZINC OXIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79952282016 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2011.01.117 Document Type: Article

Times cited : (26)

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