Application of electrostatic force microscopy on characterizing an electret fiber: Effect of tip to specimen distance on phase shift

Fibers and Polymers

Volumn 12, Issue 1, 2011, Pages 89-94

  Kim, J ^a   Hinestroza, J P ^a,b   Jasper, W ^a   Barker, R L ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

Distance; Electret fiber; Electrostatic force microscopy; Phase; Tip

Indexed keywords

DISTANCE; ELECTRICAL PROPERTY; ELECTROSTATIC FORCE MICROSCOPY; EXPERIMENTAL MEASUREMENTS; FORCE GRADIENTS; MATHEMATICAL EXPRESSIONS; PHASE; POLYMERIC MATERIAL; POLYPROPYLENE FIBER; QUALITATIVE INFORMATION; TIP; TIP GEOMETRY;

BIAS VOLTAGE; ELECTRETS; ELECTRIC PROPERTIES; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; FIBERS; PHASE MEASUREMENT; PHASE SHIFT; POLYPROPYLENES;

ELECTRIC FORCE MICROSCOPY;

EID: 79952261914     PISSN: 12299197     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12221-011-0089-1     Document Type: Article

References (22)

1. D. Bonnell, "Scanning Probe Microscopy and Spectroscopy", Wiley-VCH, New York, 2000.
2. C. Oksana, L. Chen, V. Weng, L. Yuditsky, and L. Brus, J. Phys. Chem. B, 107, 1525 (2003).
3. R. A. Said, J. Phys. D: Appl. Phys., 34, L7 (2001).
4. D. Sarid, "Scanning Force Microscopy", Revised ed., Oxford University Press, New York, 1994.
5. P. Girad, Nanotechnology, 12, 485 (2001).
6. A. Gil, J. Colchero, J. Gomez-Herrero, and A. M. Baro, Nanotechnology, 14, 332 (2003).
7. A. Biermann, B. Lum, and W. Bergman, "Proc. for 17th DOE Nuclear Air Cleaning Conference", 1982.
8. B. Cantaloube, G. Dreyfus, and J. Lewiner, J. Polym. Sci. Pol. Phys., 17, 95 (1979).
9. C. C. Chen and S. H. Huang, Am. Ind. Hyg. Assoc. J., 59, 227 (1998).
10. M. Lehtimäki and K. Heinonen, Build. Environ., 29, 353 (1994).
11. S. B. Martin and E. S. Moyer, Appl. Occup. Environ. Hyg., 15, 609 (2000).
12. C. Chen, M. Lehtimäki, and K. Wileke, Am. Ind. Hyg. Assoc. J., 54, 51 (1993).
13. W. Jasper, J. Hinestroza, A. Mohan, J. Kim, B. Shiels, M. Gunay, D. Thompson, and R. Barker, J. Aerosol Sci., 37, 903 (2006).
14. J. Kim, W. Jasper, and J. Hinestroza, J. Microscopy, 20, 1 (2007).
15. J. Chu, T. Itoh, C. Lee, and T. Suga, J. Vac. Sci. Technol. B, 15, 1551 (1997).
16. P. A. Tipler, "Physics for Scientists and Engineers", Worth Publishers, New York, 1991.
17. C. Lei, A. Das, M. Elliott, and J. Macdonald, Nanotechnology, 15, 627 (2004).
18. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B, 62, 10419 (2000).
19. S. Belaidi, P. Girad, and G. Leveque, J. Appl. Phys., 81, 1023 (1997).
20. Y. Liang, D. Bonnell, W. D. Goodhue, D. D. Rathman, and C. O. Bozler, Appl. Phys. Lett., 66, 1147 (1995).
21. G. Mesa, E. Dobado-Fuentes, and J. J. Saenz, J. Appl. Phys., 79, 39 (1996).
22. H. Yokoyama, I. Takahito, and J. Itoh, Appl. Phys. Lett., 65, 3143 (1994).