Perturbation detection of electric force gradients using the phase shift method

Journal of Physics D: Applied Physics

Volumn 34, Issue 3, 2001, Pages

  Said, R A ^a  

^a UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DEVICES; INTEGRATED CIRCUITS; MICROSCOPES; PERTURBATION TECHNIQUES; PHASE SHIFT; SENSITIVITY ANALYSIS; VIBRATIONS (MECHANICAL);

ELECTRIC FORCE GRADIENTS; ELECTROSTATIC FORCE MICROSCOPY;

FORCE MEASUREMENT;

EID: 0034825801     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/3/101     Document Type: Article

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