X-ray photoelectron spectroscopy for wheat powders: Measurement of surface chemical composition

Journal of Agricultural and Food Chemistry

Volumn 59, Issue 5, 2011, Pages 1527-1540

  Saad, Moustafa ^a   Gaiani, Claire ^b   Mullet, Martine ^c   Scher, Joel ^b   Cuq, Bernard ^a  

^a MONTPELLIER SUPAGRO   (France)

^b UNIVERSITÉ DE LORRAINE   (France)

^c Laboratoire de Chimie Physique et Microbiologie pour l'Environnement   (France)

Author keywords

lipids; polysaccharides; protein; surface chemical composition; wheat flour; XPS

Indexed keywords

ARABINOXYLANS; BULK COMPOSITIONS; CHEMICAL STRUCTURE; FUNCTIONAL PROPERTIES; SURFACE CHARACTERISTICS; SURFACE CHEMICAL COMPOSITION; SURFACE COMPOSITIONS; THREE COMPONENT; TWO-COMPONENT; WHEAT FLOUR; WHEAT FLOURS; WHEAT POWDER; WHEAT PROTEINS; XPS; XPS ANALYSIS; XPS SURVEY;

LIPIDS; PHOTOELECTRICITY; PHOTONS; POLYSACCHARIDES; POWDERS; PROTEINS; STARCH;

X RAY PHOTOELECTRON SPECTROSCOPY;

ARABINOXYLAN; LIPID; STARCH; VEGETABLE PROTEIN; XYLAN;

ARTICLE; CHEMISTRY; FLOUR; PARTICLE SIZE; PLANT SEED; SCANNING ELECTRON MICROSCOPY; WHEAT; X RAY PHOTOELECTRON SPECTROSCOPY;

FLOUR; LIPIDS; MICROSCOPY, ELECTRON, SCANNING; PARTICLE SIZE; PHOTOELECTRON SPECTROSCOPY; PLANT PROTEINS; SEEDS; STARCH; TRITICUM; XYLANS;

TRITICUM AESTIVUM;

EID: 79952125268     PISSN: 00218561     EISSN: 15205118     Source Type: Journal    
DOI: 10.1021/jf102315h     Document Type: Article

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