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Volumn 98, Issue 8, 2011, Pages

Influence of the p -type doping concentration on reflection-mode GaN photocathode

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFUSION LENGTH; ELECTRON ESCAPE; EMISSION LAYERS; FITTING RESULTS; LONG WAVELENGTH; P-TYPE DOPING;

EID: 79952083666     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3556656     Document Type: Article
Times cited : (70)

References (22)
  • 4
    • 0035898509 scopus 로고    scopus 로고
    • High current gains obtained by InGaN/GaN double heterojunction bipolar transistors with p-InGaN base
    • DOI 10.1063/1.1387261
    • T. Makimoto, K. Kumakura, and N. Kobayashi, Appl. Phys. Lett. 0003-6951 79, 380 (2001). 10.1063/1.1387261 (Pubitemid 32683697)
    • (2001) Applied Physics Letters , vol.79 , Issue.3 , pp. 380-381
    • Makimoto, T.1    Kumakura, K.2    Kobayashi, N.3
  • 5
    • 0000950031 scopus 로고    scopus 로고
    • Electron diffusion length and lifetime in p-type GaN
    • DOI 10.1063/1.122743, PII S0003695198038480
    • Z. Z. Bandić, P. M. Bridger, E. C. Piquette, and T. C. Mcgill, Appl. Phys. Lett. 0003-6951 73, 3276 (1998). 10.1063/1.122743 (Pubitemid 128677379)
    • (1998) Applied Physics Letters , vol.73 , Issue.22 , pp. 3276-3278
    • Bandic, Z.Z.1    Bridger, P.M.2    Piquette, E.C.3    McGill, T.C.4
  • 8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.