|
Volumn 73, Issue 22, 1998, Pages 3276-3278
|
Electron diffusion length and lifetime in p-type GaN
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0000950031
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.122743 Document Type: Article |
Times cited : (112)
|
References (11)
|