Pulsed eddy current imaging and frequency spectrum analysis for hidden defect nondestructive testing and evaluation

NDT and E International

Volumn 44, Issue 4, 2011, Pages 344-352

  He, Yunze ^a,b   Pan, Mengchun ^a   Luo, Feilu ^a   Tian, Guiyun ^b  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

Defect classification; Defect quantification; Frequency spectrum analysis; Hidden defect; Imaging technique; Pulsed eddy current

Indexed keywords

3-D IMAGE; C-SCAN IMAGES; C-SCAN IMAGING; COMPLEX STRUCTURE; DEFECT CHARACTERISATION; DEFECT CLASSIFICATION; EDGE EFFECT; EXCITATION COILS; FREQUENCY SPECTRUM ANALYSIS; HIDDEN DEFECT; NON-DESTRUCTIVE TESTING AND EVALUATIONS; PULSED EDDY CURRENT; RISING TIME; SUBSURFACE DEFECT; TIME DOMAIN;

ABSORPTION SPECTRA; EDDY CURRENT TESTING; EDDY CURRENTS; ELASTIC CONSTANTS; IMAGING TECHNIQUES; INTERFEROMETRY; SPECTROSCOPY; SPECTRUM ANALYSIS; THREE DIMENSIONAL; TIME DOMAIN ANALYSIS;

SURFACE DEFECTS;

EID: 79951947051     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2011.01.009     Document Type: Article

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