Pulsed eddy current signal analysis: Application to the experimental detection and characterization of deep flaws in highly conductive materials

NDT and E International

Volumn 30, Issue 3, 1997, Pages 163-170

  Lebrun, Bruno ^a   Jayet, Yves ^a   Baboux, Jean Claude ^a  

^a UNIVERSITÉ DE LYON   (France)

Author keywords

Deep flaws; Eddy currents; Pulse

Indexed keywords

CRACKS; CURRENT DENSITY; DEFECTS; EDDY CURRENT TESTING; ELECTRIC EXCITATION; NONDESTRUCTIVE EXAMINATION; SIGNAL PROCESSING;

PULSED EDDY CURRENT SIGNAL ANALYSIS;

CONDUCTIVE MATERIALS;

EID: 0031168734     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0963-8695(96)00072-2     Document Type: Article

References (11)

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