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Volumn 157, Issue 1, 2010, Pages 26-31

Defect classification based on rectangular pulsed eddy current sensor in different directions

Author keywords

Defect classification; Feature extraction; Pulsed eddy current (PEC); Rectangular exciting coil

Indexed keywords

BLIND TEST; DEFECT CLASSIFICATION; DIFFERENTIAL RESPONSE; ELECTROMAGNETIC NONDESTRUCTIVE TESTING; EXCITING COIL; MAGNETIC INDUCTION; PICK-UP COILS; PULSED EDDY CURRENT; PULSED EDDY-CURRENT SENSORS; RESPONSE SIGNAL; RISING TIME; SUBSURFACE DEFECT; TIME DOMAIN; TIME TO PEAK;

EID: 76449092828     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2009.11.012     Document Type: Article
Times cited : (112)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.