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Volumn 164, Issue 1-2, 2010, Pages 1-7

Defect characterisation based on pulsed eddy current imaging technique

Author keywords

C scan; Defect characterisation; Imaging technique; Pulsed eddy current; Rectangular exciting coil; Wavelet transform

Indexed keywords

AVERAGING METHOD; C-SCAN; C-SCAN IMAGES; CHARACTERISATION; COMPLEX DEFECTS; CORROSION TYPES; DE-NOISE; DEFECT CHARACTERISATION; ELECTROMAGNETIC METHODS; EXCITING COIL; EXCITING CURRENTS; MAGNETIC INDUCTION; NON-DESTRUCTIVE TESTING AND EVALUATIONS; PICK-UP COILS; PULSED EDDY CURRENT; RISING TIME; TWO DIRECTIONS;

EID: 78249276152     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2010.09.001     Document Type: Article
Times cited : (61)

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