Analytical modeling for transient probe response in pulsed eddy current testing

NDT and E International

Volumn 42, Issue 5, 2009, Pages 376-383

  Fan, Mengbao ^a   Huang, Pingjie ^a   Ye, Bo ^a   Hou, Dibo ^a   Zhang, Guangxin ^a   Zhou, Zekui ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Analytical modeling; Gibbs phenomenon; Multilayered conductive structures; Pulsed eddy current testing; Transient probe response

Indexed keywords

ANALYTICAL MODELING; GIBBS PHENOMENON; MULTILAYERED CONDUCTIVE STRUCTURES; PULSED EDDY CURRENT TESTING; TRANSIENT PROBE RESPONSE;

EDDY CURRENTS; EVAPORATIVE COOLING SYSTEMS; FOURIER ANALYSIS; FOURIER SERIES; HARMONIC ANALYSIS; PROBES;

EDDY CURRENT TESTING;

EID: 67349161007     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2009.01.005     Document Type: Article

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