SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 67, Issue 11, 1996, Pages 3965-3972

Thickness and conductivity of metallic layers from pulsed eddy-current measurements

(3) Tai, Cheng Chi a Rose, James H a Moulder, John C a

a Iowa State University of Science and Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CALCULATIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY MEASUREMENT; FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; MATHEMATICAL MODELS; PLATE METAL; SPURIOUS SIGNAL NOISE; TABLE LOOKUP; THICKNESS MEASUREMENT; TIME DOMAIN ANALYSIS;

INVERSION METHOD; PULSED EDDY CURRENT SIGNALS; STEP FUNCTION APPLIED VOLTAGE; SWEPT FREQUENCY TECHNIQUE; ZERO CROSSING TIME;

EDDY CURRENT TESTING;

EID: 0030287388 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1147300 Document Type: Article

Times cited : (135)

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