Tandem-phase zone-plate optics for high-energy X-ray focusing

Japanese Journal of Applied Physics

Volumn 50, Issue 2, 2011, Pages

  Kagoshima, Yasushi ^a   Takano, Hidekazu ^a   Koyama, Takahisa ^a,b   Tsusaka, Yoshiyuki ^a   Saikubo, Akihiko ^a,c  

^a UNIVERSITY OF HYOGO   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FAR-FIELD; FLOAT GLASS SURFACES; FOCUSED BEAMS; FOCUSING PROPERTIES; HIGH ENERGY X RAY; PHOTON FLUX DENSITIES; RESIDUAL TIN; TANDEM ARRANGEMENT; TWO-PHASE ZONES; TWO-POINT; X-RAY FLUORESCENCE MICROSCOPY; YOUNG'S INTERFERENCE; ZONE PLATES;

FLUORESCENCE MICROSCOPY; FOCUSING; HIGH ENERGY PHYSICS; OPTICAL INSTRUMENTS; OPTICAL SYSTEMS; TANTALUM; TIN; X RAYS;

PLATES (STRUCTURAL COMPONENTS);

EID: 79951937269     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.022503     Document Type: Article

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