Focusing high energy X-rays with stacked Fresnel zone plates

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 8, 2007, Pages 2817-2823

  Snigireva, I ^a   Snigirev, A ^a   Kohn, V ^b   Yunkin, V ^c   Grigoriev, M ^c   Kuznetsov, S ^c   Vaughan, G ^a   Di Michiel, M ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b KURCHATOV INSTITUTE   (Russian Federation)

^c INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR ALIGNMENT; FRESNEL ZONE PLATES;

FOCUSING; GLUES; SILICON;

X RAYS;

EID: 34548283469     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200675702     Document Type: Article

References (11)

1. H. Reichert, V. Honkimaki, A. Snigirev, S. Engemann, and H. Dosch, Physica B 336, 46 (2003).
2. S. Engemann, H. Reichert, H. Dosch, J. Bilgram, V. Honimaki, and A. Snigirev, Phys. Rev. Lett. 92, 205701 (2004).
3. D. Rudolph, B. Niemann, and G. Schmahl, Proc. SPIE 316, 103-105 (1982).
4. K. Saitoh, K. Inagawa, K. Kohra, C. Hayashi, A. Iida, and N. Kato, Rev. Sci. Instrum. 60, 1519-1523 (1989).
5. N. Kamijo, Y. Suzuki, H. Takamo, M. Yasumoto, A. Takeuchi, and M. Awaji, Rev. Sci. Instrum. 74, 5101-5104 (2003).
6. S. D. Shastri, J. M. Maser, B. Lai, and J. Tys, Opt. Commun. 197, 9-14 (2001).
7. J. Maser, B. Lai, W. Yun, S. D. Shastri, Z. Cai, W. Rodrigues, S. Xu, and E. Trackhtenberg, Proc. SPIE 4783, 74-81 (2002).
8. I. Snigireva, A. Snigirev, G. Vaughan, M. Di Micheil, V. Kohn, V. Yunkin, and M. Grigoriev, AIP Conf. Proc. 879, 998-1002(2007).
9. http://www.esrf.fr/UsersAndScience/Experiments/Imaging/BM05/ BeamlineGuide/EH2/MicroOpticsTest/
10. A. G. Michette, Optical systems for soft X-rays (Plenum Press, New York, London, 1986).
11. V. G. Kohn, A. Snigirev, and I. Snigireva, Crystallogr. Rep. 51, suppl. 1, S4-S11 (2006).