Computation of surface-enhanced infrared absorption spectra of particles at a surface through the finite element method

Journal of Physical Chemistry C

Volumn 115, Issue 7, 2011, Pages 3025-3033

  Vasan, Ganesh ^a   Chen, Ying ^a,b   Erbe, Andreas ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBANCES; ATTENUATED TOTAL INTERNAL REFLECTION; ELECTRIC FIELD PATTERNS; ENHANCEMENT FACTOR; GOLD PARTICLES; INTERNAL REFLECTIONS; ORGANIC SUBSTANCES; PROBE MATERIALS; SILICON CRYSTAL; SILICON SURFACES; SURFACE-ENHANCED INFRARED ABSORPTIONS; TIME-HARMONIC;

ABSORPTION; ELECTRIC FIELDS; FINITE ELEMENT METHOD; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED ABSORPTION; LIGHT ABSORPTION; MAXWELL EQUATIONS; REFRACTIVE INDEX; SURFACES;

ABSORPTION SPECTROSCOPY;

EID: 79951886090     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp108667k     Document Type: Article

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