Dielectric interlayers for increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy

Physical Chemistry Chemical Physics

Volumn 12, Issue 44, 2010, Pages 14798-14803

  Reithmeier, Martina ^a   Erbe, Andreas ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78149258583     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/c0cp01125h     Document Type: Article

References (17)

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