Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C60

Measurement Science and Technology

Volumn 22, Issue 3, 2011, Pages

  Campbellová, Anna ^a   Klapetek, Petr ^a   Valtr, Miroslav ^a  

^a CZECH METROLOGY INSTITUTE   (Czech Republic)

Author keywords

Atomic force microscopy; DFT; Uncertainty

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY FUNCTIONAL THEORY; FULLERENES; MICROSCOPES; NANOTECHNOLOGY; QUANTUM THEORY; SCANNING PROBE MICROSCOPY;

CONVOLUTION APPROACH; DIMENSIONAL MEASUREMENTS; EQUILIBRIUM POSITIONS; QUANTUM MECHANICAL; SOURCES OF UNCERTAINTY; TIGHT-BINDING APPROXIMATIONS; UNCERTAINTY; UNCERTAINTY MODELING;

UNCERTAINTY ANALYSIS;

EID: 79951885670     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/3/035106     Document Type: Article

References (16)

1. Villarrubia J S 1997 Algorithms for scanned probe microscope image simulation, surface reconstruction and tip estimation J. Res. N (Pubitemid 127665631)
2. Sugimoto Y, Pou P, Abe M, Jelinek P, Perez R, Morita S and Custance O 2007 Chemical identification of individual surface atoms by atomic force microscopy Nature 446 64-7 (Pubitemid 46348038)
3. Sugimoto Y, Jelinek P, Pou P, Abe M, Morita S, Perez R and Custance O 2007 Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy Phys. Rev. Lett. 98 106104
4. Sugimoto Y, Pou P, Custance O, Jelinek P, Abe M, Perez R and Morita S 2008 Complex patterning by vertical interchange atom manipulation using atomic force microscopy Science 322 413-7
5. Okita S, Matsumuro A and Miura K 2003 Tribological properties of a C60 monolayer film Thin Solid Films 443 66-70
6. Kobayashi K, Yamada H, Horiuchi T and Matsushige K 2000 Imaging of fullerene molecules on Si (111)-77 surface with NC-AFM Appl. Surf. Sci. 157 228-32
7. Giovanelli L and Lay G Le 2000 A chemical and morphological study of fullerene derivatives Langmuir-Blodgett films Appl. Surf. Sci. 162-163 513-8
8. Campbellová A, Klapetek P and Valtr M 2009 Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements Meas. Sci. Technol. 20 084014
9. Sankey O F and Niklewski D J 1989 Ab initio multicenter tight-binding model for molecular-dynamics simulations and other applications in covalent systems Phys. Rev. B 40 3979-95
10. Demkov A A, Ortega J, Sankey O F and Grumbach M P 1995 Electronic structure approach for complex silicas Phys. Rev. B 52 1618-30
11. Lewis J P, Glaesemann K R, Voth G A, Fritsch J, Demkov A A, Ortega J and Sankey O F 2001 Further developments in the local-orbital density-functional- theory tight-binding method Phys. Rev. B 64 195103
12. Jelínek P, Wang H, Lewis J P, Sankey O F and Ortega J 2005 Multicenter approach to the exchange-correlation interactions in ab initio tight-binding methods Phys. Rev. B 71 235101
13. Hamann D R 1989 Generalized norm-conserving pseudopotentials Phys. Rev. B 40 2980-7
14. Ceperley D M and Alder B J 1980 Ground state of the electron gas by a stochastic method Phys. Rev. Lett. 45 566-9
15. Perdew J P and Zunger A 1981 Self-interaction correction to density-functional approximations for many-electron systems Phys. Rev. B 23 5048-79
16. Song J and Cappelletti R L 1994 Lennard-Jones-potential calculation of C60 stage-one graphite Phys. Rev. B 50 14678-81