Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

Measurement Science and Technology

Volumn 20, Issue 8, 2009, Pages

  Campbellová, Anna ^a   Klapetek, Petr ^a   Valtr, Miroslav ^a  

^a CZECH METROLOGY INSTITUTE   (Czech Republic)

Author keywords

Atomic force microscopy; Carbon nanotubes; DFT; Uncertainty

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; CARBON NANOTUBES; DENSITY FUNCTIONAL THEORY; MOLECULAR DYNAMICS; NANOTECHNOLOGY; NANOTUBES; QUANTUM THEORY; SCANNING PROBE MICROSCOPY; SURFACE RELAXATION; YARN;

CLASSICAL MOLECULAR DYNAMICS; CONVOLUTION APPROACH; CRITICAL MEASUREMENTS; DIMENSIONAL MEASUREMENTS; EQUILIBRIUM POSITIONS; HIGHLY ORIENTED PYROLYTIC GRAPHITE; SOURCES OF UNCERTAINTY; UNCERTAINTY;

UNCERTAINTY ANALYSIS;

EID: 70350701805     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/8/084014     Document Type: Article

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