Chemical and morphological study of fullerene derivatives Langmuir-Blodgett films

Applied Surface Science

Volumn 162, Issue , 2000, Pages 513-518

  Giovanelli, L ^a   Le Lay, G ^a  

^a CAMPUS DE LUMINY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FULLERENES; MONOLAYERS; MORPHOLOGY; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

FULLERENE DERIVATIVES;

LANGMUIR BLODGETT FILMS;

EID: 0034248805     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00242-7     Document Type: Article

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