-
1
-
-
67650102619
-
-
0935-9648, 10.1002/adma.200900375
-
R. Waser, R. Dittmann, G. Staikov, and K. Szot, Adv. Mater. 0935-9648 21, 2632 (2009). 10.1002/adma.200900375
-
(2009)
Adv. Mater.
, vol.21
, pp. 2632
-
-
Waser, R.1
Dittmann, R.2
Staikov, G.3
Szot, K.4
-
2
-
-
43549126477
-
Resistive switching in transition metal oxides
-
DOI 10.1016/S1369-7021(08)70119-6, PII S1369702108701196
-
A. Sawa, Mater. Today 1369-7021 11, 28 (2008). 10.1016/S1369-7021(08) 70119-6 (Pubitemid 351680723)
-
(2008)
Materials Today
, vol.11
, Issue.6
, pp. 28-36
-
-
Sawa, A.1
-
3
-
-
0042378349
-
-
0003-6951, 10.1063/1.1590741
-
A. Baikalov, Y. Q. Wang, B. Shen, B. Lorenz, S. Tsui, Y. Y. Sun, Y. Y. Xue, and C. W. Chu, Appl. Phys. Lett. 0003-6951 83, 957 (2003). 10.1063/1.1590741
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 957
-
-
Baikalov, A.1
Wang, Y.Q.2
Shen, B.3
Lorenz, B.4
Tsui, S.5
Sun, Y.Y.6
Xue, Y.Y.7
Chu, C.W.8
-
4
-
-
34147108217
-
Evidence for an oxygen diffusion model for the electric pulse induced resistance change effect in transition-metal oxides
-
DOI 10.1103/PhysRevLett.98.146403
-
Y. B. Nian, J. Strozier, N. J. Wu, X. Chen, and A. Ignatiev, Phys. Rev. Lett. 0031-9007 98, 146403 (2007). 10.1103/PhysRevLett.98.146403 (Pubitemid 46557459)
-
(2007)
Physical Review Letters
, vol.98
, Issue.14
, pp. 146403
-
-
Nian, Y.B.1
Strozier, J.2
Wu, N.J.3
Chen, X.4
Ignatiev, A.5
-
5
-
-
46749093701
-
-
1748-3387, 10.1038/nnano.2008.160
-
J. J. Yang, M. D. Pickett, X. M. Li, D. A. A. Ohlberg, D. R. Steward, and R. S. Williams, Nat. Nanotechnol. 1748-3387 3, 429 (2008). 10.1038/nnano.2008. 160
-
(2008)
Nat. Nanotechnol.
, vol.3
, pp. 429
-
-
Yang, J.J.1
Pickett, M.D.2
Li, X.M.3
Ohlberg, D.A.A.4
Steward, D.R.5
Williams, R.S.6
-
6
-
-
77957684916
-
-
0003-6951, 10.1063/1.3496033
-
R. Yasuhara, T. Yamamoto, I. Ohkubo, H. Kumigashira, and M. Oshima, Appl. Phys. Lett. 0003-6951 97, 132111 (2010). 10.1063/1.3496033
-
(2010)
Appl. Phys. Lett.
, vol.97
, pp. 132111
-
-
Yasuhara, R.1
Yamamoto, T.2
Ohkubo, I.3
Kumigashira, H.4
Oshima, M.5
-
7
-
-
33745386456
-
Effect of carrier trapping on the hysteretic current-voltage characteristics in Ag La0.7 Ca0.3 MnO3 Pt heterostructures
-
DOI 10.1103/PhysRevB.73.245427
-
D. S. Shang, Q. Wang, L. D. Chen, R. Dong, X. M. Li, and W. Q. Zhang, Phys. Rev. B 0556-2805 73, 245427 (2006). 10.1103/PhysRevB.73.245427 (Pubitemid 43945846)
-
(2006)
Physical Review B - Condensed Matter and Materials Physics
, vol.73
, Issue.24
, pp. 245427
-
-
Shang, D.S.1
Wang, Q.2
Chen, L.D.3
Dong, R.4
Li, X.M.5
Zhang, W.Q.6
-
8
-
-
39749084455
-
3-Pt heterostructures
-
DOI 10.1557/jmr.2008.0072
-
D. S. Shang, L. D. Chen, Q. Wang, Z. H. Wu, W. Q. Zhang, and X. M. Li, J. Mater. Res. 0884-2914 23, 302 (2008). 10.1557/jmr.2008.0072 (Pubitemid 351298004)
-
(2008)
Journal of Materials Research
, vol.23
, Issue.2
, pp. 302-307
-
-
Shang, D.1
Chen, L.2
Wang, Q.3
Wu, Z.4
Zhang, W.5
Li, X.6
-
9
-
-
36549016052
-
Resistive switching properties of high crystallinity and low-resistance Pr0.7 Ca0.3 Mn O3 thin film with point-contacted Ag electrodes
-
DOI 10.1063/1.2816124
-
M. Fujimoto, H. Koyama, Y. Nishi, and T. Suzuki, Appl. Phys. Lett. 0003-6951 91, 223504 (2007). 10.1063/1.2816124 (Pubitemid 350191671)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.22
, pp. 223504
-
-
Fujimoto, M.1
Koyama, H.2
Nishi, Y.3
Suzuki, T.4
-
10
-
-
33745038459
-
Interface resistance switching at a few nanometer thick perovskite manganite active layers
-
DOI 10.1063/1.2211147
-
A. Sawa, T. Fujii, M. Kawasaki, and Y. Tokura, Appl. Phys. Lett. 0003-6951 88, 232112 (2006). 10.1063/1.2211147 (Pubitemid 43877735)
-
(2006)
Applied Physics Letters
, vol.88
, Issue.23
, pp. 232112
-
-
Sawa, A.1
Fujii, T.2
Kawasaki, M.3
Tokura, Y.4
-
11
-
-
67649494447
-
-
0003-6951, 10.1063/1.3159471
-
Z. L. Liao, Z. Z. Wang, Y. Meng, Z. Y. Liu, P. Gao, J. L. Gang, H. W. Zhao, X. J. Liang, X. D. Bai, and D. M. Chen, Appl. Phys. Lett. 0003-6951 94, 253503 (2009). 10.1063/1.3159471
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 253503
-
-
Liao, Z.L.1
Wang, Z.Z.2
Meng, Y.3
Liu, Z.Y.4
Gao, P.5
Gang, J.L.6
Zhao, H.W.7
Liang, X.J.8
Bai, X.D.9
Chen, D.M.10
-
12
-
-
77950589614
-
-
0021-8979, 10.1063/1.3309473
-
R. Yang, X. M. Li, W. D. Yu, X. D. Gao, D. S. Shang, and L. D. Chen, J. Appl. Phys. 0021-8979 107, 063703 (2010). 10.1063/1.3309473
-
(2010)
J. Appl. Phys.
, vol.107
, pp. 063703
-
-
Yang, R.1
Li, X.M.2
Yu, W.D.3
Gao, X.D.4
Shang, D.S.5
Chen, L.D.6
-
13
-
-
0034510782
-
Atomic imaging of the transition between oxygen chemisorption and oxide film growth on Ag{1 1 1}
-
DOI 10.1016/S0039-6028(00)00831-1
-
C. I. Carlisle, T. Fujimoto, W. S. Sim, and D. A. King, Surf. Sci. 0039-6028 470, 15 (2000). 10.1016/S0039-6028(00)00831-1 (Pubitemid 32077293)
-
(2000)
Surface Science
, vol.470
, Issue.1-2
, pp. 15-31
-
-
Carlisle, C.I.1
Fujimoto, T.2
Sim, W.S.3
King, D.A.4
-
15
-
-
4644281741
-
-
0040-6090, 10.1016/j.tsf.2004.04.009
-
F. X. Bock, T. M. Christensen, S. B. Rivers, L. D. Doucette, and R. J. Lad, Thin Solid Films 0040-6090 468, 57 (2004). 10.1016/j.tsf.2004.04.009
-
(2004)
Thin Solid Films
, vol.468
, pp. 57
-
-
Bock, F.X.1
Christensen, T.M.2
Rivers, S.B.3
Doucette, L.D.4
Lad, R.J.5
-
16
-
-
0037868562
-
-
0003-6951, 10.1063/1.1389513
-
D. Büchel, C. Mihalcea, T. Fukaya, N. Atoda, J. Tominaga, T. Kikuwa, and H. Fuji, Appl. Phys. Lett. 0003-6951 79, 620 (2001). 10.1063/1.1389513
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 620
-
-
Büchel, D.1
Mihalcea, C.2
Fukaya, T.3
Atoda, N.4
Tominaga, J.5
Kikuwa, T.6
Fuji, H.7
-
17
-
-
70149109762
-
-
0022-3727, 10.1088/0022-3727/42/13/135411
-
N. R. C. Raju, K. J. Kumar, and A. Subrahmanyam, J. Phys. D: Appl. Phys. 0022-3727 42, 135411 (2009). 10.1088/0022-3727/42/13/135411
-
(2009)
J. Phys. D: Appl. Phys.
, vol.42
, pp. 135411
-
-
Raju, N.R.C.1
Kumar, K.J.2
Subrahmanyam, A.3
-
18
-
-
0037622032
-
-
0040-6090, 10.1016/S0040-6090(03)00064-6
-
U. K. Barika, S. Srinivasan, C. L. Nagendra, and A. Subrahmanyam, Thin Solid Films 0040-6090 429, 129 (2003). 10.1016/S0040-6090(03)00064-6
-
(2003)
Thin Solid Films
, vol.429
, pp. 129
-
-
Barika, U.K.1
Srinivasan, S.2
Nagendra, C.L.3
Subrahmanyam, A.4
-
19
-
-
24644471925
-
Stability of reactively sputtered silver oxide films
-
DOI 10.1016/j.surfcoat.2005.02.005, PII S0257897205001891
-
J. F. Pierson and C. Rousselot, Surf. Coat. Technol. 0257-8972 200, 276 (2005). 10.1016/j.surfcoat.2005.02.005 (Pubitemid 41268945)
-
(2005)
Surface and Coatings Technology
, vol.200
, Issue.SPEC. ISS. 4
, pp. 276-279
-
-
Pierson, J.-F.1
Rousselot, C.2
-
20
-
-
0001629912
-
-
0556-2805, 10.1103/PhysRevB.41.3190
-
L. H. Tjeng, M. B. J. Meinders, J. van Elp, J. Ghijsen, G. A. Sawatzky, and R. L. Johnson, Phys. Rev. B 0556-2805 41, 3190 (1990). 10.1103/PhysRevB.41. 3190
-
(1990)
Phys. Rev. B
, vol.41
, pp. 3190
-
-
Tjeng, L.H.1
Meinders, M.B.J.2
Van Elp, J.3
Ghijsen, J.4
Sawatzky, G.A.5
Johnson, R.L.6
-
21
-
-
0001752924
-
-
0897-4756, 10.1021/cm00046a022
-
J. F. Weaver and G. B. Hoflund, Chem. Mater. 0897-4756 6, 1693 (1994) 10.1021/cm00046a022
-
(1994)
Chem. Mater.
, vol.6
, pp. 1693
-
-
Weaver, J.F.1
Hoflund, G.B.2
-
22
-
-
0000568228
-
-
0022-3654, 10.1021/j100085a035
-
J. F. Weaver and G. B. Hoflund, J. Phys. Chem. 0022-3654 98, 8519 (1994). 10.1021/j100085a035
-
(1994)
J. Phys. Chem.
, vol.98
, pp. 8519
-
-
Weaver, J.F.1
Hoflund, G.B.2
-
24
-
-
0038183918
-
-
0039-6028, 10.1016/S0039-6028(03)00477-1
-
M. Gillet, C. Lemire, E. Gillet, and K. Aguir, Surf. Sci. 0039-6028 532-535, 519 (2003). 10.1016/S0039-6028(03)00477-1
-
(2003)
Surf. Sci.
, vol.532-535
, pp. 519
-
-
Gillet, M.1
Lemire, C.2
Gillet, E.3
Aguir, K.4
|