-
1
-
-
0036922146
-
Impact of deep submicron technology on dependability of VLSI circuits
-
C. Constantinescu, Impact of Deep Submicron Technology on Dependability of VLSI Circuits. Dependable Systems and Networks, pp. 205-209, 2002.
-
(2002)
Dependable Systems and Networks
, pp. 205-209
-
-
Constantinescu, C.1
-
4
-
-
0344362756
-
-
Deliverable ETIE2 of Dependability Benchmarking Project, IST-2000-25245. URL
-
P.J. Gil et al., Fault Representativeness. Deliverable ETIE2 of Dependability Benchmarking Project, IST-2000-25245. URL: http://www.laas.fr/ DBench/Deliverables/ETIE2.pdf (2002).
-
(2002)
Fault Representativeness
-
-
Gil, P.J.1
-
12
-
-
67449119660
-
Injecting intermittent faults for the dependability validation of commercial microcontroller
-
D. Gil et al., Injecting Intermittent Faults for the Dependability Validation of Commercial Microcontroller. IEEE International High Level Design Validation and Test Workshop, pp. 177-184, 2008.
-
(2008)
IEEE International High Level Design Validation and Test Workshop
, pp. 177-184
-
-
Gil, D.1
-
13
-
-
79951817269
-
-
Oregano Systems, http://www.oregano.at.
-
-
-
-
15
-
-
0029728343
-
Fault behaviour observation of a microprocessor system through a VHDL simulation-based fault injection experiment
-
A.M. Amendola et al., Fault Behaviour Observation of a Microprocessor System through a VHDL Simulation-Based Fault Injection Experiment. IEEE European Design Automation Conference, pp. 536-541, 1996.
-
(1996)
IEEE European Design Automation Conference
, pp. 536-541
-
-
Amendola, A.M.1
-
16
-
-
0041633858
-
Parameter variations and impact on circuits and microarchitecture
-
S. Borkar et al., Parameter Variations and Impact on Circuits and Microarchitecture. Design Automation Conference, pp. 338-342, 2003.
-
(2003)
Design Automation Conference
, pp. 338-342
-
-
Borkar, S.1
-
17
-
-
34547188822
-
Reliability challenges for 45nm and beyond
-
DOI 10.1145/1146909.1146959, 2006 43rd ACM/IEEE Design Automation Conference, DAC'06
-
J.W. McPherson, Reliability challenges for 45nm and beyond. IEEE/ACM Design Automation Conference, pp. 176-181, 2006. (Pubitemid 47113890)
-
(2006)
Proceedings - Design Automation Conference
, pp. 176-181
-
-
McPherson, J.W.1
-
18
-
-
19944425021
-
VHDL simulation-based fault injection techniques
-
A. Benso, P. Prinetto, (eds.) Kluwer Academic Publishers
-
D. Gil et al., VHDL Simulation-Based Fault Injection Techniques. In Fault Injection Techniques and Tools for VLSI Reliability Evaluation; A. Benso, P. Prinetto, (eds.) pp. 159-176, Kluwer Academic Publishers, 2003.
-
(2003)
Fault Injection Techniques and Tools for VLSI Reliability Evaluation
, pp. 159-176
-
-
Gil, D.1
-
19
-
-
44249102333
-
Enhancement of fault injection techniques based on the modification of VHDL code
-
J.C. Baraza et al., Enhancement of Fault Injection Techniques Based on the Modification of VHDL Code. IEEE Transactions on VLSI Systems, 16(6):693-706, 2008.
-
(2008)
IEEE Transactions on VLSI Systems
, vol.16
, Issue.6
, pp. 693-706
-
-
Baraza, J.C.1
|